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P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry
by
Schulte-Schrepping, Horst
, Ivashko, Oleh
, Igoa Saldaña, Fernando
, Nowak, Rüdiger
, Winkler, Björn
, Köhler, Katharina
, Gutowski, Olof
, Glaevecke, Philipp
, Schöps, Andreas
, Dippel, Ann-Christin
, Zimmermann, Martin v.
, Liu, Jiatu
in
Beamlines
/ Chemical reactors
/ Cryostats
/ Diffraction
/ high-energy x-rays
/ Instruments
/ single-crystal diffuse scattering
/ Thin films
/ total scattering
/ x-ray diffraction
2025
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P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry
by
Schulte-Schrepping, Horst
, Ivashko, Oleh
, Igoa Saldaña, Fernando
, Nowak, Rüdiger
, Winkler, Björn
, Köhler, Katharina
, Gutowski, Olof
, Glaevecke, Philipp
, Schöps, Andreas
, Dippel, Ann-Christin
, Zimmermann, Martin v.
, Liu, Jiatu
in
Beamlines
/ Chemical reactors
/ Cryostats
/ Diffraction
/ high-energy x-rays
/ Instruments
/ single-crystal diffuse scattering
/ Thin films
/ total scattering
/ x-ray diffraction
2025
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P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry
by
Schulte-Schrepping, Horst
, Ivashko, Oleh
, Igoa Saldaña, Fernando
, Nowak, Rüdiger
, Winkler, Björn
, Köhler, Katharina
, Gutowski, Olof
, Glaevecke, Philipp
, Schöps, Andreas
, Dippel, Ann-Christin
, Zimmermann, Martin v.
, Liu, Jiatu
in
Beamlines
/ Chemical reactors
/ Cryostats
/ Diffraction
/ high-energy x-rays
/ Instruments
/ single-crystal diffuse scattering
/ Thin films
/ total scattering
/ x-ray diffraction
2025
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P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry
Journal Article
P21.1 at PETRA III – a high-energy X-ray diffraction beamline for physics and chemistry
2025
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Overview
Beamline P21.1 at PETRA III uses high-energy photons for the investigation of materials structure by diffraction methods. The instrumentation is particularly suited for probing ordering phenomena on a local scale in chemistry and physics. A detailed description of the instrumentation and detectors for such experiments is given. The beamline supports a number of sample environments for investigations under in situ and operando conditions, e.g. cryostats, furnaces, chemical reactors. Recent examples of measurements on amorphous, single-crystalline and thin film samples are described.
Publisher
John Wiley & Sons, Inc,International Union of Crystallography
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