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Upgrade of the Coherent X‐ray Scattering beamline at Pohang Light Source II
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Upgrade of the Coherent X‐ray Scattering beamline at Pohang Light Source II
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Journal Article
Upgrade of the Coherent X‐ray Scattering beamline at Pohang Light Source II
2026
Overview
The Coherent X‐ray Scattering beamline at the Pohang Light Source‐II was constructed in 2011 for coherent diffraction imaging and has now been upgraded in its focusing optics, diffractometer, detectors and endstation. The enhanced photon flux density and modified endstation have enabled routine Bragg coherent diffraction imaging and microbeam diffraction, while the newly implemented ptychography setup has enhanced nano‐imaging capability in transmission geometry. Because coherent diffraction imaging and microbeam diffraction share the same upstream optics, switching between techniques requires only minor adjustments to slit settings, mirror pitch and the sample‐to‐detector distance, enabling efficient integration of user programs without compromising instrument performance. This paper details the upgrade and the new capabilities of the beamline. Comprehensive upgrades to optics, detectors and the endstation at the CXS beamline have transformed its coherent diffraction imaging performance, enabling routine Bragg coherent diffraction imaging and microbeam diffraction, and adding the capability for transmission geometry nano‐imaging via ptychography.
Publisher
International Union of Crystallography,John Wiley & Sons, Inc
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