Catalogue Search | MBRL
Search Results Heading
Explore the vast range of titles available.
MBRLSearchResults
-
DisciplineDiscipline
-
Is Peer ReviewedIs Peer Reviewed
-
Item TypeItem Type
-
SubjectSubject
-
YearFrom:-To:
-
More FiltersMore FiltersSourceLanguage
Done
Filters
Reset
2
result(s) for
"Gorban, Sergii"
Sort by:
Photoactive Widegap Oxide Doped ZnO with Non-stoichiometric Matrix: Aspects of Formation
2021
XRD, ESR, TRMC and UV–visible spectroscopy are used for the description of characteristics of investigated systems and determination of forming structure mechanism in Al, Zr or Ce doped non-stoichiometric ZnO1−x. It was shown the Al and Zr ions substitute the lattice Zn2+ in the ZnO matrix, and as a result, the donor's levels form in ZnO bandgap and acceptor’s level of zinc vacancy. Last level is a trap of phogenerate holes in material and it allows to delay photocatalytic actvity Al- and Zr-doped ZnO. Ce ions incorporate as interstiallite ions or segregate on crystal surface that leads to appearance the f-levels in the bandgap of ZnO, and as a result, the cerium ion will trap for electron. It decreases electron lifetime or increases of hole lifetime and also if cerium ion segregates on the ZnO surface the set of reactions (Ce4+ + e- = Ce3+, Ce3+ + O2 = Ce4+ + O2−) may occur. It leads to form additional reactive oxygen species, in particular, super-anion radicals (O2−, ROS) that improve the activity of the material. As a result, the increasing of phenol degradation by 30% compared to pure ZnO may be achieved at the choice of Ce-doped ZnO catalyst.
Journal Article
Current transfer processes in a hydrated layer localized in a two-layer porous structure of nanosized ZrO2
by
Doroshkevich, Aleksandr S.
,
Lytvyn, Petro M.
,
Malyuta, Serhiy V.
in
Characterization and Evaluation of Materials
,
Chemistry and Materials Science
,
Current voltage characteristics
2022
The current transfer through a two-layer structure saturated with absorbed water, each layer of which consists of pressed ZrO
2
nanoparticles with two sizes (10 and 20 nm), has been studied. The structure was obtained using the isostatic pressing the ZrO
2
+ H
2
O powders. The form of current–voltage characteristics inherent to the studied structure, that has diode properties with the rectification coefficient close to 3, has been explained by the appearance of a potential barrier at the interlayer boundary.
Journal Article