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result(s) for
"Kelly, Joe, 1971- author"
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X-Men gold. Volume 0 : Homecoming
by
Kelly, Joe, 1971- author
,
Casey, Joe, author
,
Rosemann, Bill, author
in
X-Men (Fictitious characters) Comic books, strips, etc.
,
Superheroes Comic books, strips, etc.
,
Mutation (Biology) Comic books, strips, etc.
2018
Cyclops and Phoenix retire, ushering in a new era for the X-Men.
Advanced Production Testing of RF, SoC, and SiP Devices
by
Engelhardt, Michael
,
Kelly, Joseph
in
Components, Circuits, Devices and Systems
,
Embedded computer systems
,
Fields, Waves and Electromagnetics
2006,2007
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers you a comprehensive understanding of advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing and the peripheral testing needs and equipment that are critical to your work involving semiconductor devices. The book covers the key measurement concepts you need to understand for your varied projects and helps you explain these concepts to management to aid in the reduction of project cost, time, and resources. Moreover, you find practical information on important associated topics that have never been presented in a single reference before, including load boards (DIBs), contactors, and handlers. Based on real-world experience and packed with time-saving equations, this in-depth volume provides you with detailed discussions in a wide range of essential areas, from applied tests for RF and SOC Devices and advances in these devices, to applications, calibration, and test costs. The book serves as an excellent complement to Production Testing of RF & System-on-Chip Devices for Wireless Communications (Artech House, 2004).
Production Testing of RF and System-on-a-Chip Devices for Wireless Communications
by
Kelly, Joseph
,
Schaub, Keith
in
Components, Circuits, Devices and Systems
,
Equipment and supplies
,
Fields, Waves and Electromagnetics
2004
With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment. This hands-on reference provides you with the time-saving algorithms and practical techniques you need to handle your challenging projects with speed and confidence. The book also offers a thorough understanding of the capital expenditures involved in production testing, to help you make sound investment decisions. You discover a cost-of-test model that helps you compare and contrast production testing methods with ease.