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We report the results of temperature and frequency dependent dielectric properties of a structural modified K 0.5 Na 0.5 NbO 3 –Bi 0.5 Na 0.5 TiO 3 based material; (Bi 0.4 La 0.1 K 0.5 Nb 0.5 Fe 0.5 O 3 ) to attain a lead free alternative for the fabrication of multifunctional devices. The X-ray diffraction (XRD) analysis reveals the formation of rhombohedral crystal structure. The dielectric constant measurements indicate that the transition temperatures were independent of measured frequencies. The frequency dependent dielectric constant and loss tangent showed a decreasing trend. The observed dielectric loss anomalies were relatively weak near the transition temperature. The remnant polarization (P r ) and coercivity (E c ) of the sample were found to be 9.848 µC/cm 2 , and 0.511 kV/cm respectively.

In reviewing the growth, development and properties of dielectrics, it is worth discussing the issues of creating new materials and understanding the origin of the properties shown with external stimuli. Beginning with a brief summary of the history of the dielectric materials, this review focuses on the chronological development and recent works with possible future applications. At present, the broad class of dielectrics becomes interesting from the point of view of its diverse applications in various fields. Solid dielectrics are perhaps the most commonly used dielectrics in electrical engineering, and many solids are very good insulators. As we know, solids may be classified according to various criteria: (i) structure (as crystalline and non-crystalline solids); (ii) electrical conductivity (conductors, semiconductors and insulators); (iii) the existence of some basic properties. Dielectric materials can be divided into 32 crystal classes or point groups.