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"Electric engineering Materials"
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Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits
2011
The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transistor reliability and efficient circuit design with respect to interconnects, power and leakage at the chip level. This e-book focuses on the latest semiconductor techniques devised to address these issues. It should be a useful resource for electronic engineers and semiconductor chip designers.
Semiconductor laser engineering, reliability and diagnostics
2013
\"This reference book provides a fully integrated novel approach to the development of high power, single transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering (Part 1), reliability engineering (Part 2) and device diagnostics (Part 3) in the same book in altogether nine comprehensive chapters, and thus closes the gap in the current book literature.Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to address for effective remedies and enhanced optical strength. The discussion covers also stability criteria of critical laser characteristics and key laser robustness factors. Clear design considerations are discussed in the context of reliability engineering concepts and models, along with typical programs for reliability tests and laser product qualifications. A final extended part of novel, advanced diagnostic methods covers in detail, for the first time in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities.Further key features include: Furnishes comprehensive practical design guidelines by considering also reliability related effects and key laser robustness factors, and discusses basic laser fabrication and packaging issues. Discusses in detail diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application. Provides a systematic insight into laser degradation modes such as catastrophic optical damage, and covers a wide range of technologies to increase the optical strength of diode lasers. Discusses basic concepts and techniques of laser reliability engineering, and provides for the first time in a book details on a standard commercial program for testing the reliabity of high power diode laser. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of highly reliable devices. It features two hundred figures and tables illustrating numerous aspects of diode laser engineering, fabrication, packaging, reliability, performance, diagnostics and applications, and an extensive list of references to all addressed technical topics at the end of each chapter. With invaluable practical advice, this novel reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. \"--
Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy
by
Connor, Stephen T.
,
Aloni, Shaul
,
Hardin, Brian E.
in
639/301/299/946
,
639/301/930/12
,
639/624/1111/1116
2013
Accurately measuring the bulk minority carrier lifetime is one of the greatest challenges in evaluating photoactive materials used in photovoltaic cells. One-photon time-resolved photoluminescence decay measurements are commonly used to measure lifetimes of direct bandgap materials. However, because the incident photons have energies higher than the bandgap of the semiconductor, most carriers are generated close to the surface, where surface defects cause inaccurate lifetime measurements. Here we show that two-photon absorption permits sub-surface optical excitation, which allows us to decouple surface and bulk recombination processes even in unpassivated samples. Thus with two-photon microscopy we probe the bulk minority carrier lifetime of photovoltaic semiconductors. We demonstrate how the traditional one-photon technique can underestimate the bulk lifetime in a CdTe crystal by 10× and show that two-photon excitation more accurately measures the bulk lifetime. Finally, we generate multi-dimensional spatial maps of optoelectronic properties in the bulk of these materials using two-photon excitation.
Journal Article
Recent highlights in nanoscale and mesoscale friction
by
Manini, Nicola
,
Meyer, Ernst
,
Dietzel, Dirk
in
Asperity
,
atomic force microscopy
,
Collaboration
2018
Friction is the oldest branch of non-equilibrium condensed matter physics and, at the same time, the least established at the fundamental level. A full understanding and control of friction is increasingly recognized to involve all relevant size and time scales. We review here some recent advances on the research focusing of nano- and mesoscale tribology phenomena. These advances are currently pursued in a multifaceted approach starting from the fundamental atomic-scale friction and mechanical control of specific single-asperity combinations, e.g., nanoclusters on layered materials, then scaling up to the meso/microscale of extended, occasionally lubricated, interfaces and driven trapped optical systems, and eventually up to the macroscale. Currently, this “hot” research field is leading to new technological advances in the area of engineering and materials science.
Journal Article
Enhanced torsional actuation and stress coupling in Mn-modified 0.93(Na0.5Bi0.5TiO3)-0.07BaTiO3 lead-free piezoceramic system
by
Kumar, Prashant
,
Berik, Pelin
,
Priya, Shashank
in
10 Engineering and structural materials; 107 Glass and ceramic materials; 202 Dielectrics/Piezoelectrics/Insulators
,
304 Powder processing/Sintering
,
400 Modeling/Simulations
2017
This paper is concerned with the development of a piezoelectric d
15
shear-induced torsion actuator made of a lead-free piezoceramic material exhibiting giant piezoelectric shear stress coefficient (e
15
) and piezoelectric transverse shear actuation force comparable to that of lead-based shear-mode piezoceramics. The Mn-modified 0.93(Na
0.5
Bi
0.5
TiO
3
)-0.07BaTiO
3
(NBT-BT-Mn) composition exhibited excellent properties as a torsional transducer with piezoelectric shear stress coefficient on the order of 11.6 C m
-2
. The torsional transducer, consisting of two oppositely polarized NBT-BT-Mn d
15
mode piezoceramic shear patches, provided a rate of twist of 0.08 mm m
-1
V
-1
under quasi-static 150 V drive. The high value of piezoelectric shear d
15
coefficient in NBT-BT-Mn sample further demonstrated its potential in practical applications. These results confirm that the lead-free piezoceramics can be as effective as their lead-based counterparts.
Journal Article
Near-field surface plasmon field enhancement induced by rippled surfaces
by
D’Acunto, Mario
,
Fuso, Francesco
,
Allegrini, Maria
in
aperture scanning near-field optical microscopy
,
Apertures
,
Electric fields
2017
The occurrence of plasmon resonances on metallic nanometer-scale structures is an intrinsically nanoscale phenomenon, given that the two resonance conditions (i.e., negative dielectric permittivity and large free-space wavelength in comparison with system dimensions) are realized at the same time on the nanoscale. Resonances on surface metallic nanostructures are often experimentally found by probing the structures under investigation with radiation of various frequencies following a trial-and-error method. A general technique for the tuning of these resonances is highly desirable. In this paper we address the issue of the role of local surface patterns in the tuning of these resonances as a function of wavelength and electric field polarization. The effect of nanoscale roughness on the surface plasmon polaritons of randomly patterned gold films is numerically investigated. The field enhancement and relation to specific roughness patterns is analyzed, producing many different realizations of rippled surfaces. We demonstrate that irregular patterns act as metal–dielectric–metal local nanogaps (cavities) for the resonant plasmonic field. In turn, the numerical results are compared to experimental data obtained via aperture scanning near-field optical microscopy.
Journal Article
Predictive Control of Power Converters and Electrical Drives
by
Cortes, Patricio
,
Rodriguez, Jose
in
Automatic control
,
Electric current converters
,
Electric current converters -- Automatic control
2012
<p>The application Model Predictive Control (MPC) controls electrical energy with the use of power converters and offers a highly flexible alternative to the use of modulators and linear controllers. This new approach takes into account the discrete and nonlinear nature of the power converters and drives and promises to have a strong impact on control in power electronics in the coming decades.</p> <p><i>Predictive Control of Power Converters and Electrical Drives</i> provides a comprehensive overview of the general principles and current research into MPC and is ideal for engineers, specialists and researchers needing: </p> <ul> <li>a straightforward explanation of the theory and implementation of predictive control;</li> <li>analysis on classical converter control methods and electrical drives control methods;</li> <li>application examples and case studies demonstrating how control schemes have been implemented;</li> <li>practice in running their own MATLAB<sup>(R)</sup> simulations through the companion website.</li> </ul> <p>With the information provided, power electronics specialists will be able to start applying this new control technique. This book will help electrical, electronics and control engineers, R&D engineers, product development engineers working in power electronics and drives, and industry engineers of power conversions and motor drives. It is also a complete reference for university researchers, graduate and senior-level undergraduate students of electrical and electronics engineering, academic control specialists, and academics in electrical drives.</p> <p>URL: www.wiley.com/go/rodriguez_control</p>