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The secondary electron emission coefficient of dielectric materials will have an important impact on the performance of electronic devices and equipment. In order to understand the secondary electron emission coefficient of common dielectric materials, the collection electrode negative bias method is introduced in this study. First, the measurement method of secondary electron emission coefficient of dielectric materials is analyzed, and 20 common dielectric materials are introduced, the secondary electron emission coefficients of 20 kinds of common dielectric materials were measured and analyzed, which laid the foundation for the subsequent application of dielectric materials. The results show that among common dielectric materials, the secondary electron emission coefficients of alumina, silica and muscovite are relatively high, while those of polyimide, polycarbonate and polyester are relatively low; The surface roughness of the material will also have an important impact on the secondary electron emission coefficient. With the gradual increase of the surface roughness of the material, the undulation of the material surface will have a shielding effect and absorption effect on the secondary electrons, which will eventually lead to the gradual reduction of the secondary electron emission coefficient of the material. The research results can provide data support for the establishment of the database of secondary electron emission characteristics of common dielectric materials.