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In recent years, China’s transport industry has been booming, and among them, rail transport plays a crucial role. Along with the track laying volume and mileage of continuous growth, the track of the daily inspection work burden is increasing, the current track inspection in China is still in the manual inspection stage, it is difficult to ensure the safety of workers, so a stable, accurate, lightweight track inspection vehicle has become the development of the general trend. The core of this design is the use of Arduino as a motherboard, non-contact track detection, the ability to use the appropriate sensors to detect the track of the super-high problem, while being able to use the camera on the collection of track line information, fast and stable on the track whether there is a foreign body and the track surface levelling for the collection and sent to the upper computer, in the upper computer for subsequent image processing.

The portable rugged computer generally needs to adapt to high temperatures, hot and humid, and other harsh environments, while taking into account its portability, the machine cooling space is limited, and the motherboard carries the CPU, graphics cards, and other major heat-producing components. Therefore, some problems often occur due to the irrational design of the motherboard cooling structure, resulting in poor adaptability to high-temperature environments, arithmetic performance being difficult to fully play, and so on. In this paper, based on the use of a certain type of portable rugged computer requirements, a motherboard cooling structure is designed through the thermal structure, fan and increasing the heat dissipation area and other forms, and the type of computer cooling effect has been measured by simulation analysis and experimental verification to verify that it can enhance the cooling effect, to provide a better reference for the same type of portable rugged computer motherboard cooling structure design.

The liquid Argon TPC (LArTPC) technology is used in DUNE, the Deep Underground Neutrino Experiment, to achieve its goals as the leading-edge international experiment for neutrino science and proton decay studies. The first 10 k-ton DUNE far detector module will employ wired-based anode planes with cold readout electronics (CE) installed inside the cryostat. The CE developed for cryogenic temperatures (77-89K) operation is an optimal solution that achieves excellent noise performance and decouples the electrode and cryostat design from the readout design. This paper reviews the experience of ProtoDUNE single-phase detector located at the CERN Neutrino Platform and provides an overview of the progress of the CE development, including recent results from system integration tests involving the characterization of new versions of the cryogenic ASICs and front-end motherboards mounted on small scale anode planes immersed in cryogenic liquids.

Functional testing of motherboards in Surface Mount Technology (SMT) assembly lines is crucial. Accurate yield prediction for each test item optimizes testing strategies, reduces costs, and ensures test coverage. Manual estimation of test item yields remains common, hindering accurate on-site predictions. Existing research on motherboard yield lacks predictions for individual test items and ignores temporal correlations during placement. This paper introduces a method, a convolutional bidirectional long short-term memory attention network (CBA-Net), which combines a convolutional neural network and a bidirectional long short-term memory network with an attention mechanism for parallel processing. It preprocesses historical test data, leveraging both networks to identify key features and extract temporal correlations. The attention mechanism optimizes yield predictions by assigning weights to information at different time steps. Experimental validation using actual production data demonstrates that the proposed method performs better compared to traditional models.

With the continuous development of science and technology, artificial intelligence technology has gained a good opportunity. It has brought many conveniences to human production and life, and solved many problems that could not be solved before. How to apply electronic information technology has become the focus of attention. It can quickly solve different difficult problems in each link, improve work efficiency and design accuracy. And in the design process to improve and improve the actual design requirements at the same time to ensure the quality level. This paper designs a mobile phone anti loss device, which is mainly composed of STC89C52 minimum single chip system, Bluetooth module, power supply and anti-loss device. The anti-loss system of mobile phone needs a smart phone supporting Bluetooth to connect with the Bluetooth main board. The data between the single chip computer and Bluetooth is transmitted to the anti-loss device of mobile phone through the serial port. When the Bluetooth of the mobile phone is successfully connected to the Bluetooth motherboard, the anti-loss device shows that it is connected. When the distance between the mobile phone and the Bluetooth main board exceeds the safe distance, disconnect the connection and alarm the mobile phone and the Bluetooth main board at the same time.

Global motherboard shipment volume topped 95.2 million units in 2020, down 5.7% year-on-year. The growth of stay-at-home economy in 2020 will continue well into 2021. This has given a big boost to the motherboard industry, which has been suffering shipment declines for nearly 10 years. It is estimated that the shortage will ease when market demand gradually return to normal levels in the second half of 2021. Hence, it is anticipated global motherboard shipment volume will reach approximately 92.4 million units in 2021, down 3% year-on-year.

Functional testing is key to fulfill quality control in laptop manufacturing and is of great economic value. However, due to the unavailability of practical data, mathematical model and systematic perspective, it has barely been touched from the academic community to date. For the first time, this work provides technical understanding of the key principles of functional testing, mathematically models the general framework, elucidates existing testing strategy under the proposed framework and model, and finally proposes a specified optimization strategy which outperforms existing strategies. This work lays the model foundation for the further optimization of functional testing, and can be regarded as a good example of how a systematic approach can solve practical industrial challenges.

Metals can be reused from different residues as an alternative for the synthesis of nanoparticles. This can add value to the recycling process through the reuse of raw materials, the mitigation of contamination to the environment and human health, and the amount of waste to be discarded/treated, representing an economic, social, and environmental opportunity. Thus, this study proposed a complete route to recover and purify Cu from motherboard waste. A solution with more than 97% Cu was recovered from the scrap through a two-step leaching process, and subsequently, batch tests were realized with resin M4194 and S950 for the purification process. After this, the pH, temperature, and type of resin values were chosen for the next steps of purification. A system composed of three fixed-bed columns (using M4195 resin, flow rate of 1.50 BV h −1 , 30 cm bed height, pH 0.5, and at 298 K) was proposed. Thus, at the end of the recycling process, pure Cu precursor solution (> 99.40%) can be obtained with about 80% of the initial Cu mass. Nanoparticles were synthesized using eluted liquor as a precursor and ascorbic acid as a reducer and stabilizer, forming spherical particles with an average diameter of 160 nm. Graphical Abstract

To ensure the complete success of the satellite launch mission, components used in the aerospace field must undergo strict functional performance verification. In traditional testing methods, ATE (Automated Test Equipment) based testing methods are time-consuming, costly and have low fault coverage. The scanning based testing method has high testing costs, long testing cycles, and poor portability, making it unsuitable for the current development needs of large capacity, high-speed, and low-power memory. The built-in-self-test has a low fault coverage due to limited testing procedures. The article proposes a universal verification method for components based on FPGA (Field Programmable Gate Array) and MCU (Microcontroller Unit), which not only effectively verifies components, but also greatly reduces testing costs, solving the shortcomings of long testing cycles, high costs, difficulty in automatic control, and data analysis and processing for components. The system hardware consists of a universal verification motherboard and a functional verification daughter board, while the software consists of upper compute software, embedded software, and FPGA software. This method has successfully verified the performance and functionality of various types of storage chips, with strong universality and flexibility, achieving good verification results and ensuring the quality and reliability of domestic chips.