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35 result(s) for "Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF"
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MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials
MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials
by Michaud, P , Gauvin, R in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Quantitative Li Mapping in Al alloys by Sub-eV Resolution Energy-Filtering Transmission Electron Microscopy (EFTEM) in the Aberration-Corrected, Monochromated TEAM0.5 Instrument
Quantitative Li Mapping in Al alloys by Sub-eV Resolution Energy-Filtering Transmission Electron Microscopy (EFTEM) in the Aberration-Corrected, Monochromated TEAM0.5 Instrument
by Rossell, M , Erni, R , Watanabe, M in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Reliable Quantification of EELS Spectra with a Simple Model–Based Approach
Reliable Quantification of EELS Spectra with a Simple Model–Based Approach
by Hmielewski, ME , Oduor, JDO , Duscher, G in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Three-dimensional Microanalysis Using FIB SEM: Variations in Technique
Three-dimensional Microanalysis Using FIB SEM: Variations in Technique
by Scott, K , Davis, JM , Vicenzi, EP in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Position Averaged Convergent Beam Electron Diffraction
Position Averaged Convergent Beam Electron Diffraction
by Findlay, S , Allen, L , Stemmer, S in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Quantitative STEM-EDS Mapping and Analysis
Quantitative STEM-EDS Mapping and Analysis
by Brewer, L , Parish, C in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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The Exploration of Nanocomposition in Biphasic Polymer Nanocolloids Using a Multivariate Histogram Method Combined with Cryo-VEELS
The Exploration of Nanocomposition in Biphasic Polymer Nanocolloids Using a Multivariate Histogram Method Combined with Cryo-VEELS
by Kim, G , Meyers, D in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Statistical Analysis of Point Defects in Hydrogen Storage Materials
Statistical Analysis of Point Defects in Hydrogen Storage Materials
by Morgan, DG , Ramasse, QM , Sarahan, MC in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF , Statistical analysis
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Quantitative Analysis of Alloy Structure by Aberration Corrected STEM
Quantitative Analysis of Alloy Structure by Aberration Corrected STEM
by Weyland, M , Muddle, B in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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Characterization of Electrodeposited Copper Films with Time-of-Flight SIMS
Characterization of Electrodeposited Copper Films with Time-of-Flight SIMS
by Demers, H , Lifshin, E , West, AC in Instrumentation and Techniques , Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF
2009
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Journal Article
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