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"X‐ray optical instruments"
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An X‐ray beamline for utilizing intense, high‐energy undulator radiation
The design, development and performance of an X‐ray beamline for utilizing intense, high‐energy undulator radiation are presented. A double multilayer monochromator, consisting of 150 pairs of 3.33 nm periodic Cr/C multilayers, provides intense X‐rays by extracting a 1% energy bandwidth from high‐order harmonic undulator radiation. We experimentally confirmed a high flux of 3.4 × 1013 (1.3 × 1011) photons s−1 with a beam size of 0.7 (0.3) mm (vertical) × 2.9 (∼4) mm (horizontal) at an X‐ray energy of 100 (267) keV with a 1.0% (1.2%) energy bandwidth. Excellent performance of the high‐energy high‐flux X‐ray beam was proven by conducting high‐speed imaging analysis. The design, development and performance of an X‐ray beamline for utilizing intense, high‐energy undulator radiation are presented.
Journal Article
Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
Direct Comparison of X-ray Detector Solid Angles in Analytical Electron Microscopes
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
Challenges and New Approaches for Quantitative X-Ray Analysis in SEM at Low Beam Voltages
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
Structure and Composition Determination from Fluctuation X-ray Scattering
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
X-ray K-ratios Derived Using Extreme Overvoltage Conditions
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
Check and Specification of the Performance of EDS Systems Attached to the SEM by Means of a New Test Material EDS-TM002 and an Updated Evaluation Software Package EDS Spectrometer Test - Version 3.4
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
Practical Measurement of X-ray Detection Performance of a Large Solid-Angle Silicon Drift Detector in an Aberration-Corrected STEM
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
Improved SDD Detectors for Ultra-Fast, High-Resolution EDS in Microanalysis
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article
Measurement strategies for Quantification of Carbon in Steel using EPMA
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Journal Article