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Implant Restorations
The fourth edition of Implant Restorations: A Step-by-Step Guide provides a wealth of updated and expanded coverage on detailed procedures for restoring dental implants. Focusing on the most common treatment scenarios, it offers concise literature reviews for each chapter and easy-to-follow descriptions of the techniques, along with high-quality clinical photographs demonstrating each step.
Comprehensive throughout, this practical guide begins with introductory information on incorporating implant restorative dentistry in clinical practice. It covers diagnosis and treatment planning and digital dentistry, and addresses advances in cone beam computerized tomography (CBCT), treatment planning software, computer generated surgical guides, rapid prototype printing and impression-less implant restorative treatments, intra-oral scanning, laser sintering, and printing/milling polymer materials. Record-keeping, patient compliance, hygiene regimes, and follow-up are also covered.
* Provides an accessible step-by-step guide to commonly encountered treatment scenarios, describing procedures and techniques in an easy-to-follow, highly illustrated format
* Offers new chapters on diagnosis and treatment planning and digital dentistry
* Covers advances in cone beam computerized tomography (CBCT), computer generated surgical guides, intra-oral scanning, laser sintering, and more
An excellent and accessible guide on a burgeoning subject in modern dental practice by one of its most experienced clinicians, Implant Restorations: A Step-by-Step Guide, Fourth Edition will appeal to prosthodontists, general dentists, implant surgeons, dental students, dental assistants, hygienists, and dental laboratory technicians.
eBook
Calibration and Performance of the REgolith X-Ray Imaging Spectrometer (REXIS) Aboard NASA’s OSIRIS-REx Mission to Bennu
The REgolith X-ray Imaging Spectrometer (REXIS) instrument on board NASA’s
OSIRIS-REx
mission to the asteroid Bennu is a Class-D student collaboration experiment designed to detect fluoresced X-rays from the asteroid’s surface to measure elemental abundances. In July and November 2019 REXIS collected ∼615 hours of integrated exposure time of Bennu’s sun-illuminated surface from terminator orbits. As reported in Hoak et al. (Results from the REgolith X-ray Imaging Spectrometer (REXIS) at Bennu,
2021
) the REXIS data do not contain a clear signal of X-ray fluorescence from the asteroid, in part due to the low incident solar X-ray flux during periods of observation. To support the evaluation of the upper limits on the detectable X-ray signal that may provide insights for the properties of Bennu’s regolith, we present an overview of the REXIS instrument, its operation, and details of its in-flight calibration on astrophysical X-ray sources. This calibration includes the serendipitous detection of the transient X-ray binary MAXI J0637-430 during Bennu observations, demonstrating the operational success of REXIS at the asteroid. We convey some lessons learned for future X-ray spectroscopy imaging investigations of asteroid surfaces.
Journal Article
Recent advances in battery characterization using in situ XAFS, SAXS, XRD, and their combining techniques: From single scale to multiscale structure detection
Revealing and clarifying the chemical reaction processes and mechanisms inside the batteries will bring a great help to the controllable preparation and performance modulation of batteries. Advanced characterization techniques based on synchrotron radiation (SR) have accelerated the development of various batteries over the past decade. In situ SR techniques have been widely used in the study of electrochemical reactions and mechanisms due to their excellent characteristics. Herein, the three most wide and important synchrotron radiation techniques used in battery research were systematically reviewed, namely X‐ray absorption fine structure (XAFS) spectroscopy, small‐angle X‐ray scattering (SAXS), and X‐ray diffraction (XRD). Special attention is paid to how these characterization techniques are used to understand the reaction mechanism of batteries and improve the practical characteristics of batteries. Moreover, the in situ combining techniques advance the acquisition of single scale structure information to the simultaneous characterization of multiscale structures, which will bring a new perspective to the research of batteries. Finally, the challenges and future opportunities of SR techniques for battery research are featured based on their current development. Advanced characterization techniques contribute to revealing and clarifying the chemical reaction processes and mechanisms inside the batteries. This review comprehensively overviews the recent advances in battery characterization using in situ synchrotron X‐ray absorption fine structure (XAFS), small‐angle X‐ray scattering (SAXS), X‐ray diffraction (XRD), and their combining techniques.
Journal Article
Simultaneous Femtosecond X-ray Spectroscopy and Diffraction of Photosystem II at Room Temperature
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of photosystem II (PS II) at room temperature. This method probes the overall protein structure and the electronic structure of the Mn₄ CaO₅ cluster in the oxygen-evolving complex of PS II. XRD data are presented from both the dark state (S₁) and the first illuminated state (S₂) of PS II. Our simultaneous XRD-XES study shows that the PS II crystals are intact during our measurements at the LCLS, not only with respect to the structure of PS II, but also with regard to the electronic structure of the highly radiation-sensitive Mn₄CaO₅ cluster, opening new directions for future dynamics studies.
Journal Article
Femtosecond x-ray spectroscopy of an electrocyclic ring-opening reaction
The ultrafast light-activated electrocyclic ring-opening reaction of 1,3-cyclohexadiene is a fundamental prototype of photochemical pericyclic reactions. Generally, these reactions are thought to proceed through an intermediate excited-state minimum (the so-called pericyclic minimum), which leads to isomerization via nonadiabatic relaxation to the ground state of the photoproduct. Here, we used femtosecond (fs) soft x-ray spectroscopy near the carbon K-edge (~284 electron volts) on a table-top apparatus to directly reveal the valence electronic structure of this transient intermediate state. The core-to-valence spectroscopic signature of the pericyclic minimum observed in the experiment was characterized, in combination with time-dependent density functional theory calculations, to reveal overlap and mixing of the frontier valence orbital energy levels. We show that this transient valence electronic structure arises within 60 ± 20 fs after ultraviolet photoexcitation and decays with a time constant of 110 ± 60 fs.
Journal Article