Asset Details
MbrlCatalogueTitleDetail
Do you wish to reserve the book?
An Introduction to Surface Analysis by XPS and AES
by
Watts, John F
in
Auger effect
/ Electron spectroscopy
/ Engineering & allied operations
/ Photoelectron spectroscopy
/ Surfaces (Technology)
/ Surfaces (Technology) -- Analysis
2019,2020
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
You are currently in the queue to collect this book. You will be notified once it is your turn to collect the book.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Oops! Something went wrong.
While trying to remove the title from your shelf something went wrong :( Kindly try again later!
Do you wish to request the book?
An Introduction to Surface Analysis by XPS and AES
by
Watts, John F
in
Auger effect
/ Electron spectroscopy
/ Engineering & allied operations
/ Photoelectron spectroscopy
/ Surfaces (Technology)
/ Surfaces (Technology) -- Analysis
2019,2020
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
eBook
An Introduction to Surface Analysis by XPS and AES
2019,2020
Request Book From Autostore
and Choose the Collection Method
Overview
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis
This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum.
Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques.
* Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification
* Explores key spectroscopic techniques in surface analysis
* Provides descriptions of latest instruments and techniques
* Includes a detailed glossary of key surface analysis terms
* Features an extensive bibliography of key references and additional reading
* Uses a non-theoretical style to appeal to industrial surface analysis sectors
An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Publisher
John Wiley et Sons Ltd,Wiley,John Wiley & Sons, Incorporated,Wiley-Blackwell
Subject
ISBN
9781119417644, 1119417643, 1119417589, 9781119417583
This website uses cookies to ensure you get the best experience on our website.