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The Cryogenic Refractive Indices of S‐FTM16, a Unique Optical Glass for Near‐Infrared Instruments
by
Brown, Warren R.
, Epps, Harland W.
, Fabricant, Daniel G.
in
Cryogenic temperature
/ Cryogenics
/ Glass
/ Light refraction
/ Prisms
/ Refractometers
/ Room temperature
/ Temperature dependence
/ Thermal expansion
/ Wavelengths
2004
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The Cryogenic Refractive Indices of S‐FTM16, a Unique Optical Glass for Near‐Infrared Instruments
by
Brown, Warren R.
, Epps, Harland W.
, Fabricant, Daniel G.
in
Cryogenic temperature
/ Cryogenics
/ Glass
/ Light refraction
/ Prisms
/ Refractometers
/ Room temperature
/ Temperature dependence
/ Thermal expansion
/ Wavelengths
2004
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Do you wish to request the book?
The Cryogenic Refractive Indices of S‐FTM16, a Unique Optical Glass for Near‐Infrared Instruments
by
Brown, Warren R.
, Epps, Harland W.
, Fabricant, Daniel G.
in
Cryogenic temperature
/ Cryogenics
/ Glass
/ Light refraction
/ Prisms
/ Refractometers
/ Room temperature
/ Temperature dependence
/ Thermal expansion
/ Wavelengths
2004
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The Cryogenic Refractive Indices of S‐FTM16, a Unique Optical Glass for Near‐Infrared Instruments
Journal Article
The Cryogenic Refractive Indices of S‐FTM16, a Unique Optical Glass for Near‐Infrared Instruments
2004
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Overview
The Ohara glass S‐FTM16 is of considerable interest for near‐infrared optical designs because it transmits well through theKband and because negative S‐FTM16 elements can be used to accurately achromatize positive calcium fluoride elements in refractive collimators and cameras. Glass manufacturers have sophisticated equipment to measure the refractive index at room temperature, but cannot typically measure the refractive index at cryogenic temperatures. Near‐infrared optics, however, operate at cryogenic temperatures to reduce thermal background. Thus, we need to know the temperature dependence of S‐FTM16’s refractive index. We report here our measurements of the thermal dependence of S‐FTM16’s refractive index between room temperature and ∼77 K. Within our measurement errors we find no evidence for a wavelength dependence or a nonlinear temperature term, so our series of measurements can be reduced to a single number. We find that
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K−1between 298 and ∼77 K and in the wavelength range 0.6–2.6 μm. We estimate that the systematic error (which dominates the measurement error) in our measurement is 10%, sufficiently low for most purposes. We also find the integrated linear thermal expansion of S‐FTM16 between 298 and 77 K is −0.00167 m m−1.
Publisher
The University of Chicago Press,University of Chicago Press
Subject
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