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Self-calibrating evaluation method for microwave interferometry measurements
by
Hoffmann, K
, Prihoda, M
in
amplitude measurement
/ Exact sciences and technology
/ Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
/ Instruments, apparatus, components and techniques common to several branches of physics and astronomy
/ light interferometry
/ light reflection
/ microwave interferometry measurement
/ microwave measurement
/ Microwave technology
/ nonelectric quantity measurement
/ phase measurement
/ Physics
/ reflection
/ self‐calibrating evaluation method
2013
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Self-calibrating evaluation method for microwave interferometry measurements
by
Hoffmann, K
, Prihoda, M
in
amplitude measurement
/ Exact sciences and technology
/ Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
/ Instruments, apparatus, components and techniques common to several branches of physics and astronomy
/ light interferometry
/ light reflection
/ microwave interferometry measurement
/ microwave measurement
/ Microwave technology
/ nonelectric quantity measurement
/ phase measurement
/ Physics
/ reflection
/ self‐calibrating evaluation method
2013
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Self-calibrating evaluation method for microwave interferometry measurements
by
Hoffmann, K
, Prihoda, M
in
amplitude measurement
/ Exact sciences and technology
/ Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
/ Instruments, apparatus, components and techniques common to several branches of physics and astronomy
/ light interferometry
/ light reflection
/ microwave interferometry measurement
/ microwave measurement
/ Microwave technology
/ nonelectric quantity measurement
/ phase measurement
/ Physics
/ reflection
/ self‐calibrating evaluation method
2013
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Self-calibrating evaluation method for microwave interferometry measurements
Journal Article
Self-calibrating evaluation method for microwave interferometry measurements
2013
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Overview
Microwave interferometry provides a sensitive measurement of amplitudes and phases of reflections. Basically, the interferometric system can be used to measure a non-electrical quantity, such as distance. Presented is a new method to evaluate data from a microwave interferometer. The method is compared with the previously used procedure. The new method provides more accurate results and also offers the possibility of self-calibration.
Publisher
The Institution of Engineering and Technology,Institution of Engineering and Technology
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