Asset Details
MbrlCatalogueTitleDetail
Do you wish to reserve the book?
Statistical Modeling of Wall Roughness and Its Influence on NLOS VLC Channels in Underground Mining
by
Sánchez, Iván
, Azurdia Meza, Cesar
, Cornejo, Sebastian
, Palacios Játiva, Pablo
in
Analysis
/ channel modeling
/ Light
/ Mineral industry
/ Mines and mineral resources
/ Mining
/ Mining industry
/ Probability distribution
/ Propagation
/ reflections channel components
/ underground mining
/ underground mining visible light communication (UM-VLC)
/ visible light communication (VLC)
/ Wireless communications
2025
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
You are currently in the queue to collect this book. You will be notified once it is your turn to collect the book.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Statistical Modeling of Wall Roughness and Its Influence on NLOS VLC Channels in Underground Mining
by
Sánchez, Iván
, Azurdia Meza, Cesar
, Cornejo, Sebastian
, Palacios Játiva, Pablo
in
Analysis
/ channel modeling
/ Light
/ Mineral industry
/ Mines and mineral resources
/ Mining
/ Mining industry
/ Probability distribution
/ Propagation
/ reflections channel components
/ underground mining
/ underground mining visible light communication (UM-VLC)
/ visible light communication (VLC)
/ Wireless communications
2025
Oops! Something went wrong.
While trying to remove the title from your shelf something went wrong :( Kindly try again later!
Do you wish to request the book?
Statistical Modeling of Wall Roughness and Its Influence on NLOS VLC Channels in Underground Mining
by
Sánchez, Iván
, Azurdia Meza, Cesar
, Cornejo, Sebastian
, Palacios Játiva, Pablo
in
Analysis
/ channel modeling
/ Light
/ Mineral industry
/ Mines and mineral resources
/ Mining
/ Mining industry
/ Probability distribution
/ Propagation
/ reflections channel components
/ underground mining
/ underground mining visible light communication (UM-VLC)
/ visible light communication (VLC)
/ Wireless communications
2025
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Statistical Modeling of Wall Roughness and Its Influence on NLOS VLC Channels in Underground Mining
Journal Article
Statistical Modeling of Wall Roughness and Its Influence on NLOS VLC Channels in Underground Mining
2025
Request Book From Autostore
and Choose the Collection Method
Overview
This study investigates the impact of wall roughness on the performance of the Non-Line-of-Sight (NLOS) component in Visible Light Communication (VLC) systems designed for underground mining environments, adhering to safety and communication standards such as IEC 60079-28(intrinsic safety in explosive atmospheres) and IEEE 802.15.7 (VLC parameters). Using probabilistic models aligned with the ITU-R P.1238 propagation guidelines, the research evaluates how wall materials (e.g., coal, shale, limestone) and their irregular geometries, characterized by surface roughness profiles compliant with ISO 8503-2,influence reflection coefficients (0.05–0.85 range), incidence angles (0°–90°), and irradiance angles (5°–180°), which are critical for signal propagation. Simulation scenarios, parameterized with material reflectivity data from ASTM E423, explore the effects of statistical distributions (uniform, normal with μ = 0.3, σ = 0.2; exponential λ = 2; gamma α = 0.5, β = 0.2) on power distribution, channel impulse response, and reflection coefficients. The results indicate variations in maximum received power: a decrease of 80% for uniform distribution, an increase of 150% for exponential distribution, and a 100% increase for gamma distribution in reflection conditions. Under incidence and irradiance conditions, uniform distribution exhibited a 158.62% increase, whereas exponential distribution and gamma distribution experienced reductions of 72.22% and 7.04%, respectively. These variations align with IEC 62973-1 EMI limits and emphasize the role of roughness (Ra = 0.8–12.5 μm per ASME B46.1).
Publisher
MDPI AG
This website uses cookies to ensure you get the best experience on our website.