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A buckling-based metrology for measuring the elastic moduli of polymeric thin films

by Beers, Kathryn L. , Stafford, Christopher M. , Amis, Eric J. , Karim, Alamgir , Miller, Robert D. , Kim, Ho-Cheol , VanLandingham, Mark R. , Volksen, Willi , Simonyi, Eva E. , Harrison, Christopher

in Biomaterials / Chemistry and Materials Science / Coatings / Condensed Matter Physics / Crystallography - instrumentation / Crystallography - methods / Elasticity / Equipment Design / Equipment Failure Analysis / Materials Science / Materials Testing - instrumentation / Materials Testing - methods / Membranes, Artificial / Nanotechnology / Nanotechnology - instrumentation / Nanotechnology - methods / Optical and Electronic Materials / Packaging / Physical Stimulation - instrumentation / Physical Stimulation - methods / Polymers / Polymers - chemistry / Polystyrenes - chemistry / Reproducibility of Results / Sensitivity and Specificity / Thin films

2004

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A buckling-based metrology for measuring the elastic moduli of polymeric thin films

2004

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2004

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Journal Article

A buckling-based metrology for measuring the elastic moduli of polymeric thin films

Beers, Kathryn L.,

Stafford, Christopher M.,

Amis, Eric J.,

Karim, Alamgir,

Miller, Robert D.,

Kim, Ho-Cheol,

VanLandingham, Mark R.,

Volksen, Willi,

Simonyi, Eva E.,

Harrison, Christopher

2004

Overview

As technology continues towards smaller, thinner and lighter devices, more stringent demands are placed on thin polymer films as diffusion barriers, dielectric coatings, electronic packaging and so on. Therefore, there is a growing need for testing platforms to rapidly determine the mechanical properties of thin polymer films and coatings. We introduce here an elegant, efficient measurement method that yields the elastic moduli of nanoscale polymer films in a rapid and quantitative manner without the need for expensive equipment or material-specific modelling. The technique exploits a buckling instability that occurs in bilayers consisting of a stiff, thin film coated onto a relatively soft, thick substrate. Using the spacing of these highly periodic wrinkles, we calculate the film's elastic modulus by applying well-established buckling mechanics. We successfully apply this new measurement platform to several systems displaying a wide range of thicknessess (nanometre to micrometre) and moduli (MPa to GPa).

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Publisher

Nature Publishing Group UK,Nature Publishing Group

Subject

Biomaterials

/ Chemistry and Materials Science

/ Coatings

/ Condensed Matter Physics

/ Crystallography - instrumentation

/ Crystallography - methods

/ Elasticity