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An improved adaptive sampling strategy for freeform surface inspection on CMM
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An improved adaptive sampling strategy for freeform surface inspection on CMM
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Journal Article
An improved adaptive sampling strategy for freeform surface inspection on CMM
2018
Overview
The components with freeform surface are widely used in industrial fields. The machining quality of freeform surface becomes increasingly significant. Coordinate measuring machine (CMM), as a conventional dimensional measuring instrument, is commonly used to inspect freeform surface. The sampling strategy, consisting of distribution of sampling points and sample size, is important to the effectiveness and accuracy of the measurements performed on CMM. The present work aims at proposing an improved adaptive sampling strategy based on a machining error model (MEM) for freeform surface inspection on CMM. The machining error model is built to determine the distribution of sampling points adaptively. In addition, Hammersley sequence is adopted to address the aliasing problem. Experiments are performed to compare presented strategy with four well-known sampling strategies. Results prove that the MEM is valid and the present strategy is reliable and effective.
Publisher
Springer London,Springer Nature B.V
