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Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization
Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization
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Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization
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Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization
Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization

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Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization
Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization
Journal Article

Improved Carrier-Envelope Phase Determination Method for Few-Cycle Laser Pulses Using High-Order Above-Threshold Ionization

2022
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Overview
Recent studies indicate that the stereo-ATI carrier-envelope phase meter (CEPM) is an effective method to determine the carrier-envelope phase (CEP) of each and every single few-cycle laser pulse. In this method, a two-dimensional parametric asymmetry plot (PAP), which can be obtained with the measured data in two short time-of-flight intervals, is applied to extract the CEP. Thus, part of the data containing useful CEP information is discarded in the PAP method. In this work, an improved method was developed to effectively exploit most of the experimental data. By this method, we achieve a CEP precision of 57 mrad over the entire 2π range for 5.0 fs laser pulses.