Asset Details
Do you wish to reserve the book?
Control theory for skewed distribution under operation side of the telecommunication industry and hard-bake process in the semiconductor manufacturing process
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Control theory for skewed distribution under operation side of the telecommunication industry and hard-bake process in the semiconductor manufacturing process
Do you wish to request the book?
Control theory for skewed distribution under operation side of the telecommunication industry and hard-bake process in the semiconductor manufacturing process
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Journal Article
Control theory for skewed distribution under operation side of the telecommunication industry and hard-bake process in the semiconductor manufacturing process
2024
Overview
Statistical process control basically involves inspecting a random sample of the output from a process and deciding whether the process is producing products with characteristics that fall within a predetermined range. It is used extensively in the field of reliability engineering. The reliability of the production process is thoroughly monitored for any internal variation using the SPC. The aim is always to settle such variations through a proper control monitoring. If the underlying distribution of the process is known to the researcher than the use of parametric control charts are useful but in many cases when there is doubt about the distribution of the process then it is preferred to use non parametric control charts. In this paper we propose the modified Exponentially weighted moving average (EWMA), Double Exponentially weighted moving average (DEWMA), Hybrid Exponentially weighted moving average (HEWMA), Extended Exponentially weighted moving average (EEWMA), Modified Exponentially weighted moving average (MEWMA) and mix- type control charts by mixing these control charts with Tukey control chart EWMA-TCC, DEWMA-TCC, HEWMA-TCC, EEWMA-TCC, MEWMA-TCC for the shape parameter of the Kumaraswamy Lehmann-2 Power function distribution (KL2PFD).
Publisher
SAGE Publications,Sage Publications Ltd,SAGE Publishing
