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Development of an Image Analysis Method for Pepperpot Emittance Monitors
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Development of an Image Analysis Method for Pepperpot Emittance Monitors
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Journal Article
Development of an Image Analysis Method for Pepperpot Emittance Monitors
2024
Overview
At the RIKEN Nishina Center for Accelerator-Based Science, we developed a pepperpot emittance monitor using a method that can change the distance between the pepperpot mask and the screen. The accuracy can be improved by correctly identifying the beam’s position at a close range followed by the increase of the distance; however, if the distance is increased excessively, the position matching will be difficult. To solve this problem, we developed a method for tracking continuous changes on a screen using optical flow. Using this method, the distance between the pepperpot mask and screen could be extended without plotting in the wrong area in the phase space, and the emittance measurement accuracy was successfully improved by more than 10%. This development will enable beam transport simulations to be performed more accurately.
Publisher
IOP Publishing
Subject
