Journal Article

Nanoscale force sensing of an ultrafast nonlinear optical response

Miyahara, Yoichi, Grütter, Peter, Cooke, David G., Schumacher, Zeno, Rejali, Rasa, Pachlatko, Raphael, Spielhofer, Andreas, Nagler, Philipp

2020

Overview

The nonlinear optical response of a material is a sensitive probe of electronic and structural dynamics under strong light fields. The induced microscopic polarizations are usually detected via their far-field light emission, thus limiting spatial resolution. Several powerful near-field techniques circumvent this limitation by employing local nanoscale scatterers; however, their signal strength scales unfavorably as the probe volume decreases. Here, we demonstrate that time-resolved atomic force microscopy is capable of temporally and spatially resolving the microscopic, electrostatic forces arising from a nonlinear optical polarization in an insulating dielectric driven by femtosecond optical fields. The measured forces can be qualitatively explained by a second-order nonlinear interaction in the sample. The force resulting from this nonlinear interaction has frequency components below the mechanical resonance frequency of the cantilever and is thus detectable by regular atomic force microscopy methods. The capability to measure a nonlinear polarization through its electrostatic force is a powerful means to revisit nonlinear optical effects at the nanoscale, without the need for emitted photons or electrons from the surface.

• Publisher: National Academy of Sciences
• Subject: Atomic force microscopy / Electrostatic properties / Emissions control / Far fields / Light emission / Measurement methods / Microscopes / Microscopy / Nonlinear optics / Nonlinear response / Optical polarization / Photons / Physical Sciences / Physics / Polarization / Signal strength / Spatial discrimination / Spatial resolution