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Measuring the optical permittivity of two-dimensional materials without a priori knowledge of electronic transitions
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Measuring the optical permittivity of two-dimensional materials without a priori knowledge of electronic transitions
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Journal Article
Measuring the optical permittivity of two-dimensional materials without a priori knowledge of electronic transitions
2019
Overview
We propose a deterministic method to measure the optical permittivity of two-dimensional (2D) materials without
knowledge of the electronic transitions over the spectral window of interest. Using the thin-film approximation, we show that the ratio of reflection coefficients for s and p polarization can give a unique solution to the permittivity of 2D materials within the measured spectral window. The uniqueness and completeness of our permittivity measurement method do not require
knowledge of the electronic transitions of a given material. We experimentally demonstrate that the permittivity of monolayers of MoS
, WS
, and WSe
in the visible frequency range can be accurately obtained by our method. We believe that our method can provide fast and reliable measurement of the optical permittivity of newly discovered 2D materials.
Publisher
De Gruyter,John Wiley & Sons, Inc,Wiley
