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Geant4-based electromagnetic background model for the CRESST dark matter experiment
Geant4-based electromagnetic background model for the CRESST dark matter experiment
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Geant4-based electromagnetic background model for the CRESST dark matter experiment
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Geant4-based electromagnetic background model for the CRESST dark matter experiment
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Geant4-based electromagnetic background model for the CRESST dark matter experiment
Geant4-based electromagnetic background model for the CRESST dark matter experiment
Journal Article

Geant4-based electromagnetic background model for the CRESST dark matter experiment

2019
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Overview
The CRESST (Cryogenic Rare Event Search with Superconducting Thermometers) dark matter search experiment aims for the detection of dark matter particles via elastic scattering off nuclei in \\[\\mathrm {CaWO_4}\\] crystals. To understand the CRESST electromagnetic background due to the bulk contamination in the employed materials, a model based on Monte Carlo simulations was developed using the Geant4 simulation toolkit. The results of the simulation are applied to the TUM40 detector module of CRESST-II phase 2. We are able to explain up to \\[(68 \\pm 16)\\,\\mathrm {\\%}\\] of the electromagnetic background in the energy range between 1 and \\[40\\,\\mathrm {keV}\\].