Asset Details
MbrlCatalogueTitleDetail
Do you wish to reserve the book?
Aging and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
by
Holze, Rudolf
, Wu, Yuping
, Chen, Xuecheng
in
Capacitors
2023
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
You are currently in the queue to collect this book. You will be notified once it is your turn to collect the book.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Oops! Something went wrong.
While trying to remove the title from your shelf something went wrong :( Kindly try again later!
Do you wish to request the book?
Aging and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
by
Holze, Rudolf
, Wu, Yuping
, Chen, Xuecheng
in
Capacitors
2023
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Aging and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
Journal Article
Aging and Degradation of Supercapacitors: Causes, Mechanisms, Models and Countermeasures
2023
Request Book From Autostore
and Choose the Collection Method
Overview
The most prominent and highly visible advantage attributed to supercapacitors of any type and application, beyond their most notable feature of high current capability, is their high stability in terms of lifetime, number of possible charge/discharge cycles or other stability-related properties. Unfortunately, actual devices show more or less pronounced deterioration of performance parameters during time and use. Causes for this in the material and component levels, as well as on the device level, have only been addressed and discussed infrequently in published reports. The present review attempts a complete coverage on these levels; it adds in modelling approaches and provides suggestions for slowing down ag(e)ing and degradation.
Publisher
MDPI AG
Subject
MBRLCatalogueRelatedBooks
Related Items
Related Items
We currently cannot retrieve any items related to this title. Kindly check back at a later time.
This website uses cookies to ensure you get the best experience on our website.