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Structure-Property Correlations in CoFe-SiO2 Nanogranular Films Utilizing x-Ray Photoelectron Spectroscopy and Small-Angle Scattering Techniques : ADVANCED MATERIALS FOR POWER ELECTRONICS AND POWER CONDITIONING SYSTEMS
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Structure-Property Correlations in CoFe-SiO2 Nanogranular Films Utilizing x-Ray Photoelectron Spectroscopy and Small-Angle Scattering Techniques : ADVANCED MATERIALS FOR POWER ELECTRONICS AND POWER CONDITIONING SYSTEMS
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Structure-Property Correlations in CoFe-SiO2 Nanogranular Films Utilizing x-Ray Photoelectron Spectroscopy and Small-Angle Scattering Techniques : ADVANCED MATERIALS FOR POWER ELECTRONICS AND POWER CONDITIONING SYSTEMS
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Conference Proceeding
Structure-Property Correlations in CoFe-SiO2 Nanogranular Films Utilizing x-Ray Photoelectron Spectroscopy and Small-Angle Scattering Techniques : ADVANCED MATERIALS FOR POWER ELECTRONICS AND POWER CONDITIONING SYSTEMS
2014
Publisher
Springer
Subject
/ Condensed matter: electronic structure, electrical, magnetic, and optical properties
/ Condensed matter: structure, mechanical and thermal properties
/ Cross-disciplinary physics: materials science; rheology
/ Diamagnetism, paramagnetism and superparamagnetism
/ Exact sciences and technology
/ Magnetic properties and materials
/ Nanoscale materials and structures: fabrication and characterization
/ Other topics in nanoscale materials and structures
/ Physics
/ Structure of solids and liquids; crystallography
