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Radiation tolerance tests on key components of the ePIC-dRICH readout card

by Wheadon, R , Simula, F , Preghenella, R , Noto, F , Tassi, E , Martinelli, M , Capuani, F , Dellacasa, G , Falchieri, D , Panzieri, D , Fazio, S , Vicini, P , Calivà, A , Agrawal, N , Rignanese, L , Perticaroli, P , Ammendola, R , Cossio, F , Rovati, E , Ruspa, M , Baldanza, C , Frezza, O , Mingioni, C , Antonioli, P , Capua, M , Contalbrigo, M , Pontisso, L , Garbini, M , Mignone, M , Nenni, M , Funicello, N , Ciardiello, A , Tuvè, C , Vallarino, S , Achari, B R , Polizzi, L , Jacazio, N , Occhiuto, L , Plavully, S , Saputi, A , Ripoli, C , Geminiani, S , Cisbani, E , F Lo Cicero , Paladino, A , De Caro, A , Urciuoli, G M , Alexeev, M , Mammoliti, F , Torromeo, G , De Gruttola, D , Biagioni, A , Chiosso, M , Ricci, R , Tamponi, U , Lonardo, A , Alice, C , Spizzo, F , Rossi, C , Rubini, N , Malaguti, R , Barion, L , M Da Rocha Rolo

in Data acquisition / Proton irradiation / Radiation tolerance / Radiators / Single Event Effects / Single event upsets / Systems design

2026

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Radiation tolerance tests on key components of the ePIC-dRICH readout card

in Data acquisition / Proton irradiation / Radiation tolerance / Radiators / Single Event Effects / Single event upsets / Systems design

2026

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Radiation tolerance tests on key components of the ePIC-dRICH readout card

in Data acquisition / Proton irradiation / Radiation tolerance / Radiators / Single Event Effects / Single event upsets / Systems design

2026

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Paper

Radiation tolerance tests on key components of the ePIC-dRICH readout card

Wheadon, R,

Simula, F,

Preghenella, R,

Noto, F,

Tassi, E,

Martinelli, M,

Capuani, F,

Dellacasa, G,

Falchieri, D,

Panzieri, D,

Fazio, S,

Vicini, P,

Calivà, A,

Agrawal, N,

Rignanese, L,

Perticaroli, P,

Ammendola, R,

Cossio, F,

Rovati, E,

Ruspa, M,

Baldanza, C,

Frezza, O,

Mingioni, C,

Antonioli, P,

Capua, M,

Contalbrigo, M,

Pontisso, L,

Garbini, M,

Mignone, M,

Nenni, M,

Funicello, N,

Ciardiello, A,

Tuvè, C,

Vallarino, S,

Achari, B R,

Polizzi, L,

Jacazio, N,

Occhiuto, L,

Plavully, S,

Saputi, A,

Ripoli, C,

Geminiani, S,

Cisbani, E,

F Lo Cicero,

Paladino, A,

De Caro, A,

Urciuoli, G M,

Alexeev, M,

Mammoliti, F,

Torromeo, G,

De Gruttola, D,

Biagioni, A,

Chiosso, M,

Ricci, R,

Tamponi, U,

Lonardo, A,

Alice, C,

Spizzo, F,

Rossi, C,

Rubini, N,

Malaguti, R,

Barion, L,

M Da Rocha Rolo

2026

Overview

The dual-radiator RICH detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5x5x12 cm^3 in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny417 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.

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Publisher

Cornell University Library, arXiv.org

Subject

Data acquisition

/ Proton irradiation

/ Radiation tolerance

/ Radiators

/ Single Event Effects

/ Single event upsets

/ Systems design