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The Coherent X‐ray Scattering beamline at the Pohang Light Source‐II was constructed in 2011 for coherent diffraction imaging and has now been upgraded in its focusing optics, diffractometer, detectors and endstation. The enhanced photon flux density and modified endstation have enabled routine Bragg coherent diffraction imaging and microbeam diffraction, while the newly implemented ptychography setup has enhanced nano‐imaging capability in transmission geometry. Because coherent diffraction imaging and microbeam diffraction share the same upstream optics, switching between techniques requires only minor adjustments to slit settings, mirror pitch and the sample‐to‐detector distance, enabling efficient integration of user programs without compromising instrument performance. This paper details the upgrade and the new capabilities of the beamline. Comprehensive upgrades to optics, detectors and the endstation at the CXS beamline have transformed its coherent diffraction imaging performance, enabling routine Bragg coherent diffraction imaging and microbeam diffraction, and adding the capability for transmission geometry nano‐imaging via ptychography.

An endstation for resonant inelastic X‐ray scattering (RIXS), dedicated to operations in the hard X‐ray regime, has been constructed at the 1C beamline of Pohang Light Source II. At the Ir L3‐edge, a total energy resolution of 34.2 meV was achieved, close to the theoretical estimation of 34.0 meV, which considers factors such as the incident energy bandpass, intrinsic analyzer resolution, geometrical broadening of the spectrometer, finite beam‐size effect and Johann aberration. The performance of the RIXS instrument is demonstrated by measuring the RIXS spectra of Sr2IrO4. The endstation can be easily reconfigured to measure energy‐integrated intensities with very low background for diffuse scattering and diffraction experiments. A hard X‐ray resonant inelastic X‐ray scattering endstation has been developed and commissioned at the 1C beamline of Pohang Light Source II.