Search Results Heading

Mohammed Bin Rashid Library /
Catalogue /
Catalogue Search

Explore the vast range of titles available.

MBRLSearchResults

mbrl.module.common.modules.added.book.to.shelf
Title added to your shelf!
View what I already have on My Shelf.
Thanks
Oops! Something went wrong.
Oops! Something went wrong.
While trying to add the title to your shelf something went wrong :( Kindly try again later!
Done
Are you sure you want to remove the book from the shelf?
{{itemTitle}}
{{itemTitle}}
by {{itemAuthor}} In {{itemCategory}}, {{itemType}}
Confirm
Oops! Something went wrong.
Oops! Something went wrong.
While trying to remove the title from your shelf something went wrong :( Kindly try again later!
Done
    Done
    Filters
    Reset
  • Discipline
      Done
      Discipline
      Clear All
      Discipline
  • Is Peer Reviewed
      Done
      Is Peer Reviewed
      Clear All
      Is Peer Reviewed
  • Item Type
      Done
      Item Type
      Clear All
      Item Type
  • Subject
      Done
      Subject
      Clear All
      Subject
      • Add
      Clear Filters
  • Year
      Done
      Year
      Clear All
      From:
      -
      To:
  • More Filters
1 result(s) for "nonfailure analysis"
Sort by:
Yield estimation model for lithography hotspot distortions
Yield estimation model for lithography hotspot distortions
by Gómez, S , Moll, F in Applied sciences , Circuits and systems , distortion
2013
A yield formulation model to estimate the amount of lithography distortion expected in a printed layout is proposed. The yield formulation relates the probability of non-failure of a lithography hotspot with the yield loss. The application of the yield model is demonstrated for three different layout configurations showing that unidimensional designs may improve manufacturing yield.
Journal Article
Share this book
Add to My Shelf