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A novel profilometer based on cylindrical ionization chambers for electron beam diagnostics
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A novel profilometer based on cylindrical ionization chambers for electron beam diagnostics
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Journal Article
A novel profilometer based on cylindrical ionization chambers for electron beam diagnostics
2025
Overview
In this work is proposed to use the profilometer based on thin cylindrical ionization chambers as a tool for electron beam diagnostics. The suggested device is based on multi-angle scanning method. To test this profilometer system experimental studies on microtron MT-25 were conducted in which were measured transverse distributions of electron beam intensity at different distances. Results show the efficacy of using a novel profilometer with set of ionization chambers as part of detector system for measurement the real spatial characteristics of a given electron beam.
Publisher
IOP Publishing
Subject
