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Test Points Selection for Analog Fault Dictionary Techniques
by
Long, Bing
, Yang, Chenglin
, Tian, Shulin
in
Algorithms
/ Analog
/ CAE) and Design
/ Circuits and Systems
/ Computer-Aided Engineering (CAD
/ Electrical Engineering
/ Engineering
/ Studies
/ Testing
2009
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Do you wish to request the book?
Test Points Selection for Analog Fault Dictionary Techniques
by
Long, Bing
, Yang, Chenglin
, Tian, Shulin
in
Algorithms
/ Analog
/ CAE) and Design
/ Circuits and Systems
/ Computer-Aided Engineering (CAD
/ Electrical Engineering
/ Engineering
/ Studies
/ Testing
2009
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Test Points Selection for Analog Fault Dictionary Techniques
Journal Article
Test Points Selection for Analog Fault Dictionary Techniques
2009
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Overview
The test points selection problem for analog fault dictionary is researched extensively in many literatures. Various test points selection strategies and criteria for Integer-Coded fault wise table are described and compared in this paper. Firstly, the construction method of Integer-Coded fault wise table for analog fault dictionary is described. Secondly, theory and algorithms associated with these strategies and criteria are reviewed. Thirdly, the time complexity and solution accuracy of existing algorithms are analyzed and compared. Then, a more accurate test points selection strategy is proposed based on the existing strategies. Finally, statistical experiments are carried out and the accuracy and efficiency of different strategies and criteria are compared in a set of comparative tables and figures. Theoretical analysis and statistical experimental results given in this paper can provide an instruction for coding an efficient and accurate test points selection algorithm easily.
Publisher
Springer US,Springer Nature B.V
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