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Opto-electronic properties of solution-processed zinc oxide thin films: role of solvents and doping
by
Manuraj, M.
, Unni, K. N. Narayanan
, Surendran, K. P.
, Hanna, B.
in
Atomic beam spectroscopy
/ Atomic force microscopy
/ Carrier density
/ Carrier mobility
/ Characterization and Evaluation of Materials
/ Charge distribution
/ Chemistry and Materials Science
/ Current carriers
/ Doping
/ Electrical properties
/ Electromagnetism
/ Energy gap
/ Fourier transforms
/ Glass substrates
/ Hall effect
/ Infrared analysis
/ Materials Science
/ Morphology
/ Nitrogen
/ Optical and Electronic Materials
/ Optical properties
/ Optoelectronics
/ Sol-gel processes
/ Solvents
/ Thickness
/ Thin films
/ Wurtzite
/ X-ray diffraction
/ Zinc oxide
/ Zinc oxides
2020
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Opto-electronic properties of solution-processed zinc oxide thin films: role of solvents and doping
by
Manuraj, M.
, Unni, K. N. Narayanan
, Surendran, K. P.
, Hanna, B.
in
Atomic beam spectroscopy
/ Atomic force microscopy
/ Carrier density
/ Carrier mobility
/ Characterization and Evaluation of Materials
/ Charge distribution
/ Chemistry and Materials Science
/ Current carriers
/ Doping
/ Electrical properties
/ Electromagnetism
/ Energy gap
/ Fourier transforms
/ Glass substrates
/ Hall effect
/ Infrared analysis
/ Materials Science
/ Morphology
/ Nitrogen
/ Optical and Electronic Materials
/ Optical properties
/ Optoelectronics
/ Sol-gel processes
/ Solvents
/ Thickness
/ Thin films
/ Wurtzite
/ X-ray diffraction
/ Zinc oxide
/ Zinc oxides
2020
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Opto-electronic properties of solution-processed zinc oxide thin films: role of solvents and doping
by
Manuraj, M.
, Unni, K. N. Narayanan
, Surendran, K. P.
, Hanna, B.
in
Atomic beam spectroscopy
/ Atomic force microscopy
/ Carrier density
/ Carrier mobility
/ Characterization and Evaluation of Materials
/ Charge distribution
/ Chemistry and Materials Science
/ Current carriers
/ Doping
/ Electrical properties
/ Electromagnetism
/ Energy gap
/ Fourier transforms
/ Glass substrates
/ Hall effect
/ Infrared analysis
/ Materials Science
/ Morphology
/ Nitrogen
/ Optical and Electronic Materials
/ Optical properties
/ Optoelectronics
/ Sol-gel processes
/ Solvents
/ Thickness
/ Thin films
/ Wurtzite
/ X-ray diffraction
/ Zinc oxide
/ Zinc oxides
2020
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Opto-electronic properties of solution-processed zinc oxide thin films: role of solvents and doping
Journal Article
Opto-electronic properties of solution-processed zinc oxide thin films: role of solvents and doping
2020
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Overview
Undoped zinc oxide (ZnO) and nitrogen-doped zinc oxide (NZO) thin films were prepared on transparent conducting oxide-coated glass substrates by employing sol–gel technique. The effect of different solvents and nitrogen doping on the optical, structural, and electrical properties was investigated by UV–visible absorption spectroscopy, atomic force microscopy (AFM), X-ray diffraction (XRD), profilometry, and Hall effect studies. ZnO films yielded transmittance above 85% and the bandgap of ZnO thin films decreased with doping. XRD pattern confirmed hexagonal wurtzite structure of ZnO. NZO thin films were found to be in the nano-thin film phase with thickness of 40 nm. Hall effect studies yielded carrier concentration of 1.2 × 10
15
cm
−3
and 2.03 × 10
14
cm
−3
, respectively, for undoped and doped ZnO thin films. The changes in vibrational modes of ZnO due to nitrogen doping were detected using Fourier transform infrared (FTIR) analysis. It was found that p-type doping, leading to an improved surface morphology, led to a reduction in optical bandgap and an increased charge carrier mobility. The choice of the solvent was found to have a profound influence on the surface morphology, optical bandgap, tail states distribution, and charge carrier mobility.
Publisher
Springer US,Springer Nature B.V
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