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A new texture descriptor for data-driven constitutive modeling of anisotropic plasticity
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A new texture descriptor for data-driven constitutive modeling of anisotropic plasticity
A new texture descriptor for data-driven constitutive modeling of anisotropic plasticity

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A new texture descriptor for data-driven constitutive modeling of anisotropic plasticity
A new texture descriptor for data-driven constitutive modeling of anisotropic plasticity
Journal Article

A new texture descriptor for data-driven constitutive modeling of anisotropic plasticity

2023
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Overview
Constitutive modeling of anisotropic plastic material behavior traditionally follows a deductive scheme, relying on empirical observations that are cast into analytic equations, the so-called phenomenological yield functions. Recently, data-driven constitutive modeling has emerged as an alternative to phenomenological models as it offers a more general way to describe the material behavior with no or fewer assumptions. In data-driven constitutive modeling, methods of statistical learning are applied to infer the yield function directly from a data set generated by experiments or numerical simulations. Currently these data sets solely consist of stresses and strains, considering the microstructure only implicitly. Similar to the phenomenological approach, this limits the generality of the inferred material model, as it is only valid for the specific material employed in the virtual or physical experiments. In this work, we present a new generic descriptor for crystallographic texture that allows an explicit consideration of the microstructure in data-driven constitutive modeling. This descriptor compromises between generality and complexity and is based on an approximately equidistant discretization of the orientation space. We prove its ability to capture the structure–property relationships between a variety of cubic–orthorhombic textures and their anisotropic plastic behavior expressed by the yield function Yld2004-18p. Three different machine learning models trained with the descriptor can predict yield loci as well as r -values of unseen microstructures with sufficient accuracy. The descriptor allows an explicit consideration of crystallographic texture, providing a pathway to microstructure-sensitive data-driven constitutive modeling.