Asset Details
Do you wish to reserve the book?
Nanointerferometric amplitude and phase reconstruction of tightly focused vector beams
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Nanointerferometric amplitude and phase reconstruction of tightly focused vector beams
Do you wish to request the book?
Nanointerferometric amplitude and phase reconstruction of tightly focused vector beams
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Journal Article
Nanointerferometric amplitude and phase reconstruction of tightly focused vector beams
2014
Overview
Highly confined vectorial electromagnetic field distributions are an excellent tool for detailed studies in nano-optics, such as nonlinear microscopy
1
, advanced fluorescence imaging
2
,
3
or nanoplasmonics
4
,
5
. Such field distributions can be generated, for instance, by tight focusing of polarized light beams
6
,
7
,
8
,
9
. To guarantee high resolution in the investigation of objects with subwavelength dimensions, precise knowledge of the spatial distribution of the exciting vectorial field is of utmost importance. The full-field reconstruction methods presented to date involve, for example, complex near-field techniques
10
,
11
,
12
,
13
. Here, we demonstrate a simple and straightforward-to-implement measurement scheme and reconstruction algorithm based on the scattering signal of a single spherical nanoparticle as a field probe. We are able to reconstruct the amplitudes and relative phases of the individual focal field components with subwavelength resolution from a single scan measurement without the need for polarization analysis of the scattered light. This scheme has the potential to improve microscopy and nanoscopy techniques.
An easily implementable reconstruction scheme is demonstrated for determining the full vectorial amplitude and relative phase distributions of highly confined electromagnetic fields with subwavelength resolution from a single-scan measurement. This scheme will help improve microscopy and nanoscopy techniques.
Publisher
Nature Publishing Group UK,Nature Publishing Group
Subject
