MbrlCatalogueTitleDetail

Do you wish to reserve the book?
Root cause analysis of manufacturing variation from optical scanning data
Root cause analysis of manufacturing variation from optical scanning data
Hey, we have placed the reservation for you!
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
You are currently in the queue to collect this book. You will be notified once it is your turn to collect the book.
Oops! Something went wrong.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Root cause analysis of manufacturing variation from optical scanning data
Oops! Something went wrong.
Oops! Something went wrong.
While trying to remove the title from your shelf something went wrong :( Kindly try again later!
Title added to your shelf!
Title added to your shelf!
View what I already have on My Shelf.
Oops! Something went wrong.
Oops! Something went wrong.
While trying to add the title to your shelf something went wrong :( Kindly try again later!
Do you wish to request the book?
Root cause analysis of manufacturing variation from optical scanning data
Root cause analysis of manufacturing variation from optical scanning data

Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
How would you like to get it?
We have requested the book for you! Sorry the robot delivery is not available at the moment
We have requested the book for you!
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Root cause analysis of manufacturing variation from optical scanning data
Root cause analysis of manufacturing variation from optical scanning data
Journal Article

Root cause analysis of manufacturing variation from optical scanning data

2024
Request Book From Autostore and Choose the Collection Method
Overview
Identifying the root causes of part-to-part variation is a central problem in most six-sigma programs, especially of modern manufacturing processes. This is challenging as the sources and patterns of the variation are often unknown or previously unidentified. A small literature aims to address this problem by discovering unknown, previously unidentified variation sources, in a manner that helps understand their nature, from only a sample of measurement data. However, the common solution of this literature is unideal for this objective in terms of both methodology and metrology aspects. This paper proposes a convolutional generative modeling framework for optical scanning data to address this limitation. The proposed approach can correctly discover the true variation sources and visualize their individual patterns in two manufacturing examples, without any prior knowledge of the variation. The approach also outperforms state-of-the-art methods in these examples.