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Thickness dependent electronic properties of Pt dichalcogenides
by
Huang, Shin-Ming
, Lin, Hsin
, Crisostomo, Christian P.
, Chuang, Feng-Chuan
, Padama, Allan Abraham B.
, Albao, Marvin A.
, Huang, Zhi-Quan
, Villaos, Rovi Angelo B.
in
639/301/1034/1038
/ 639/301/119/995
/ 639/301/357/1018
/ 639/766/119/544
/ Chalcogenides
/ Chemistry and Materials Science
/ Crystal structure
/ Density of states
/ Electronic properties
/ Energy gap
/ Film thickness
/ First principles
/ Free energy
/ Heat of formation
/ Interlayers
/ Lattice parameters
/ Materials Science
/ Mathematical analysis
/ Monolayers
/ Nanotechnology
/ Platinum
/ Polytypes
/ Quantum confinement
/ Singularities
/ Surfaces and Interfaces
/ Synthesis
/ Tellurium
/ Thin Films
/ Transition metal compounds
/ Valence band
2019
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Thickness dependent electronic properties of Pt dichalcogenides
by
Huang, Shin-Ming
, Lin, Hsin
, Crisostomo, Christian P.
, Chuang, Feng-Chuan
, Padama, Allan Abraham B.
, Albao, Marvin A.
, Huang, Zhi-Quan
, Villaos, Rovi Angelo B.
in
639/301/1034/1038
/ 639/301/119/995
/ 639/301/357/1018
/ 639/766/119/544
/ Chalcogenides
/ Chemistry and Materials Science
/ Crystal structure
/ Density of states
/ Electronic properties
/ Energy gap
/ Film thickness
/ First principles
/ Free energy
/ Heat of formation
/ Interlayers
/ Lattice parameters
/ Materials Science
/ Mathematical analysis
/ Monolayers
/ Nanotechnology
/ Platinum
/ Polytypes
/ Quantum confinement
/ Singularities
/ Surfaces and Interfaces
/ Synthesis
/ Tellurium
/ Thin Films
/ Transition metal compounds
/ Valence band
2019
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Thickness dependent electronic properties of Pt dichalcogenides
by
Huang, Shin-Ming
, Lin, Hsin
, Crisostomo, Christian P.
, Chuang, Feng-Chuan
, Padama, Allan Abraham B.
, Albao, Marvin A.
, Huang, Zhi-Quan
, Villaos, Rovi Angelo B.
in
639/301/1034/1038
/ 639/301/119/995
/ 639/301/357/1018
/ 639/766/119/544
/ Chalcogenides
/ Chemistry and Materials Science
/ Crystal structure
/ Density of states
/ Electronic properties
/ Energy gap
/ Film thickness
/ First principles
/ Free energy
/ Heat of formation
/ Interlayers
/ Lattice parameters
/ Materials Science
/ Mathematical analysis
/ Monolayers
/ Nanotechnology
/ Platinum
/ Polytypes
/ Quantum confinement
/ Singularities
/ Surfaces and Interfaces
/ Synthesis
/ Tellurium
/ Thin Films
/ Transition metal compounds
/ Valence band
2019
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Thickness dependent electronic properties of Pt dichalcogenides
Journal Article
Thickness dependent electronic properties of Pt dichalcogenides
2019
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Overview
Platinum-based transition metal dichalcogenides have been gaining renewed interest because of the development of a new method to synthesize thin film structures. Here, using first-principles calculation, we explore the electronic properties of PtX
2
(X = S, Se, and Te) with respect to film thickness. For bulk and layered structures (1 to 10 layers), octahedral 1T is the most stable. Surprisingly, we also find that the 3R structure has comparable stability relative to the 1T, implying possible synthesis of 3R. For a bulk 1T structure, PtS
2
is semiconducting with an indirect band gap of 0.25 eV, while PtSe
2
and PtTe
2
are both semi-metallic. Still, all their corresponding monolayers exhibit an indirect semiconducting phase with band gaps of 1.68, 1.18, and 0.40 eV for PtS
2
, PtSe
2
, and PtTe
2
, respectively. For the band properties, we observe that all these materials manifest decreasing/closing of indirect band gap with increasing thickness, a consequence of quantum confinement and interlayer interaction. Moreover, we discover that controlling the thickness and applying strain can manipulate van Hove singularity resulting to high density of states at the maximum valence band. Our results exhibit the sensitivity and tunability of electronic properties of PtX
2
, paving a new path for future potential applications.
First-principles calculations: electronic properties of Pt-based dichalcogenides
Layered Pt-based dichalcogenides possess thickness-dependent electronic band structures. A team led by Feng-Chuan Chuang at National Sun Yat-Sen University performed first-principles calculations to investigate the interplay between thickness and electronic properties of PtX
2
dichalcogenides, where X = S, Se, and Te. In bulk PtX
2
, the most stable configuration was found to be 1T, although the metastable 3R structure had comparable formation energy, indicating that both 1T and 3R polytypes could be synthesized experimentally. To explore the thickness-dependent properties of PtX
2
, bulk lattice constants were used to construct the layered structures from monolayer up to ten layers, followed by crystal structure relaxations, and it was consistently found that the electronic band gap decreases as the number of layers increases. Furthermore, PtS
2
possesses diverging density of states, indicative of possible presence of van Hove singularities.
Publisher
Nature Publishing Group UK,Nature Publishing Group
Subject
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