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Automatic identification of crystal structures and interfaces via artificial-intelligence-based electron microscopy
by
Liebscher, Christian H.
, Leitherer, Andreas
, Ghiringhelli, Luca M.
, Yeo, Byung Chul
in
639/301/119/544
/ 639/766/930/328/1649
/ Artificial intelligence
/ Artificial neural networks
/ Bayesian analysis
/ Characterization and Evaluation of Materials
/ Chemistry and Materials Science
/ Classification
/ Computational Intelligence
/ Crystal lattices
/ Crystal structure
/ Deep learning
/ Energy
/ Fourier transforms
/ Grain boundaries
/ Information theory
/ Intelligence
/ Interfaces
/ Machine learning
/ Materials Science
/ Mathematical and Computational Engineering
/ Mathematical and Computational Physics
/ Mathematical Modeling and Industrial Mathematics
/ Neural networks
/ Scanning transmission electron microscopy
/ Spectrum analysis
/ Symmetry
/ Theoretical
/ Training
/ Transmission electron microscopy
2023
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Automatic identification of crystal structures and interfaces via artificial-intelligence-based electron microscopy
by
Liebscher, Christian H.
, Leitherer, Andreas
, Ghiringhelli, Luca M.
, Yeo, Byung Chul
in
639/301/119/544
/ 639/766/930/328/1649
/ Artificial intelligence
/ Artificial neural networks
/ Bayesian analysis
/ Characterization and Evaluation of Materials
/ Chemistry and Materials Science
/ Classification
/ Computational Intelligence
/ Crystal lattices
/ Crystal structure
/ Deep learning
/ Energy
/ Fourier transforms
/ Grain boundaries
/ Information theory
/ Intelligence
/ Interfaces
/ Machine learning
/ Materials Science
/ Mathematical and Computational Engineering
/ Mathematical and Computational Physics
/ Mathematical Modeling and Industrial Mathematics
/ Neural networks
/ Scanning transmission electron microscopy
/ Spectrum analysis
/ Symmetry
/ Theoretical
/ Training
/ Transmission electron microscopy
2023
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Automatic identification of crystal structures and interfaces via artificial-intelligence-based electron microscopy
by
Liebscher, Christian H.
, Leitherer, Andreas
, Ghiringhelli, Luca M.
, Yeo, Byung Chul
in
639/301/119/544
/ 639/766/930/328/1649
/ Artificial intelligence
/ Artificial neural networks
/ Bayesian analysis
/ Characterization and Evaluation of Materials
/ Chemistry and Materials Science
/ Classification
/ Computational Intelligence
/ Crystal lattices
/ Crystal structure
/ Deep learning
/ Energy
/ Fourier transforms
/ Grain boundaries
/ Information theory
/ Intelligence
/ Interfaces
/ Machine learning
/ Materials Science
/ Mathematical and Computational Engineering
/ Mathematical and Computational Physics
/ Mathematical Modeling and Industrial Mathematics
/ Neural networks
/ Scanning transmission electron microscopy
/ Spectrum analysis
/ Symmetry
/ Theoretical
/ Training
/ Transmission electron microscopy
2023
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Automatic identification of crystal structures and interfaces via artificial-intelligence-based electron microscopy
Journal Article
Automatic identification of crystal structures and interfaces via artificial-intelligence-based electron microscopy
2023
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Overview
Characterizing crystal structures and interfaces down to the atomic level is an important step for designing advanced materials. Modern electron microscopy routinely achieves atomic resolution and is capable to resolve complex arrangements of atoms with picometer precision. Here, we present AI-STEM, an automatic, artificial-intelligence based method, for accurately identifying key characteristics from atomic-resolution scanning transmission electron microscopy (STEM) images of polycrystalline materials. The method is based on a Bayesian convolutional neural network (BNN) that is trained only on simulated images. AI-STEM automatically and accurately identifies crystal structure, lattice orientation, and location of interface regions in synthetic and experimental images. The model is trained on cubic and hexagonal crystal structures, yielding classifications and uncertainty estimates, while no explicit information on structural patterns at the interfaces is included during training. This work combines principles from probabilistic modeling, deep learning, and information theory, enabling automatic analysis of experimental, atomic-resolution images.
Publisher
Nature Publishing Group UK,Nature Publishing Group,Nature Portfolio
Subject
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