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Mutation-Based Multivariate Time-Series Anomaly Generation on Latent Space with an Attention-Based Variational Recurrent Neural Network for Robust Anomaly Detection in an Industrial Control System
by
Seo, Jung Taek
, Jeon, Seungho
, Moon, Daesung
, Koo, Kijong
in
Algorithms
/ anomaly generation
/ attention mechanism
/ Classification
/ Control systems
/ Cybersecurity
/ Datasets
/ industrial control system
/ Methods
/ Mutation
/ Neural networks
/ Physical instruments
/ Probability distribution
/ recurrent neural network
/ variational Bayes
2024
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Mutation-Based Multivariate Time-Series Anomaly Generation on Latent Space with an Attention-Based Variational Recurrent Neural Network for Robust Anomaly Detection in an Industrial Control System
by
Seo, Jung Taek
, Jeon, Seungho
, Moon, Daesung
, Koo, Kijong
in
Algorithms
/ anomaly generation
/ attention mechanism
/ Classification
/ Control systems
/ Cybersecurity
/ Datasets
/ industrial control system
/ Methods
/ Mutation
/ Neural networks
/ Physical instruments
/ Probability distribution
/ recurrent neural network
/ variational Bayes
2024
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Do you wish to request the book?
Mutation-Based Multivariate Time-Series Anomaly Generation on Latent Space with an Attention-Based Variational Recurrent Neural Network for Robust Anomaly Detection in an Industrial Control System
by
Seo, Jung Taek
, Jeon, Seungho
, Moon, Daesung
, Koo, Kijong
in
Algorithms
/ anomaly generation
/ attention mechanism
/ Classification
/ Control systems
/ Cybersecurity
/ Datasets
/ industrial control system
/ Methods
/ Mutation
/ Neural networks
/ Physical instruments
/ Probability distribution
/ recurrent neural network
/ variational Bayes
2024
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Mutation-Based Multivariate Time-Series Anomaly Generation on Latent Space with an Attention-Based Variational Recurrent Neural Network for Robust Anomaly Detection in an Industrial Control System
Journal Article
Mutation-Based Multivariate Time-Series Anomaly Generation on Latent Space with an Attention-Based Variational Recurrent Neural Network for Robust Anomaly Detection in an Industrial Control System
2024
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Overview
Anomaly detection involves identifying data that deviates from normal patterns. Two primary strategies are used: one-class classification and binary classification. In Industrial Control Systems (ICS), where anomalies can cause significant damage, timely and accurate detection is essential, often requiring analysis of time-series data. One-class classification is commonly used but tends to have a high false alarm rate. To address this, binary classification is explored, which can better differentiate between normal and anomalous data, though it struggles with class imbalance in ICS datasets. This paper proposes a mutation-based technique for generating ICS time-series anomalies. The method maps ICS time-series data into a latent space using a variational recurrent autoencoder, applies mutation operations, and reconstructs the time-series, introducing plausible anomalies that reflect multivariate correlations. Evaluations of ICS datasets show that these synthetic anomalies are visually and statistically credible. Training a binary classifier on data augmented with these anomalies effectively mitigates the class imbalance problem.
Publisher
MDPI AG
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