Asset Details
Do you wish to reserve the book?
Analysis of Dark Current in BRITE Nanostellite CCD Sensors
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Analysis of Dark Current in BRITE Nanostellite CCD Sensors
Do you wish to request the book?
Analysis of Dark Current in BRITE Nanostellite CCD Sensors
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Journal Article
Analysis of Dark Current in BRITE Nanostellite CCD Sensors
2018
Overview
The BRightest Target Explorer (BRITE) is the pioneering nanosatellite mission dedicated for photometric observations of the brightest stars in the sky. The BRITE charge coupled device (CCD) sensors are poorly shielded against extensive flux of energetic particles which constantly induce defects in the silicon lattice. In this paper we investigate the temporal evolution of the generation of the dark current in the BRITE CCDs over almost four years after launch. Utilizing several steps of image processing and employing normalization of the results, it was possible to obtain useful information about the progress of thermal activity in the sensors. The outcomes show a clear and consistent linear increase of induced damage despite the fact that only about 0.14% of CCD pixels were probed. By performing the analysis of temperature dependencies of the dark current, we identified the observed defects as phosphorus-vacancy (PV) pairs, which are common in proton irradiated CCD matrices. Moreover, the Meyer-Neldel empirical rule was confirmed in our dark current data, yielding E M N = 24.8 meV for proton-induced PV defects.
Publisher
MDPI AG,MDPI
Subject
