Journal Article

Research on a General SER Rate Prediction Model Based on a Set of Configuration Parameters Related to SER

Du, Shougang, Wang, Shulong, Chen, Shupeng

2025

Overview

This article comprehensively analyzes the new developments and challenges faced by several typical prediction models in the field of radiation effects in recent years. The models discussed include the RPP model, the extended RPP (rectangular parallelepiped) model, and the IRPP (integral rectangular parallelepiped) model. The article conducts a comprehensive analysis of the limitations of the assumption that uses the linear energy transfer (LET) of incident particles and the SEU (single-particle upset) cross-section (without considering the energy and type of ions) to predict the rate of single-particle effects (SEUs). Additionally, the article points out that with the continuous progress of integrated circuit technology, the geometric shape of the target circuit, the energy of the incident particles, the type of particles, and more precise physical models corresponding to the interaction between radiation and matter have become increasingly important in evaluating the sensitivity to single-particle effects (SEEs). Subsequently, based on the probability characteristics of SEE, a series of general estimation equations for the SEE rate are derived, considering particle energy, particle type, and the probability of influence at a specific moment. Then, by introducing the concept of interaction volume, the concept of sensitive volume is further expanded, and using these general equations, the relationship between the SEE rate cross-section and the SEE projected area is derived, simplifying the SEU rate prediction equation to a form that can be directly used in engineering applications. Finally, the article emphasizes a complete method of applying the general prediction equation to engineering to estimate the radiation disturbance performance of two typical verification circuits, and provides the corresponding prediction results.

• Publisher: MDPI AG,MDPI
• Subject: Analysis / Circuits / Cosmic rays / Cross-sections / Energy / Integrated circuits / IRPP / LET / Linear energy transfer (LET) / Monte Carlo simulation / Parallelepipeds / Particle energy / Prediction models / Probability / Radiation / Radiation effects / RPP / Semiconductor chips / Sensitivity analysis / SER / SER rate prediction