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Resolution enhancement on single‐shot X‐ray spectrometers using a detuned non‐dispersive multi‐crystal analyzer
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Resolution enhancement on single‐shot X‐ray spectrometers using a detuned non‐dispersive multi‐crystal analyzer
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Journal Article
Resolution enhancement on single‐shot X‐ray spectrometers using a detuned non‐dispersive multi‐crystal analyzer
2025
Overview
This study proposes and demonstrates a simple method for improving the energy resolution in a single‐shot X‐ray spectrometer, which consists of a focusing mirror and a single‐crystal analyzer. Two Si(220) channel‐cut crystals arranged in a non‐dispersive geometry are employed as the analyzer. The angular width of diffraction for the multi‐crystal analyzer is reduced by detuning one of the crystals, thereby enhancing the energy resolution of the spectrometer while maintaining the energy range. A proof‐of‐principle experiment with 10.4 keV X‐rays clearly shows a resolution enhancement by a factor of two. It was found that X‐ray penetration within the crystals broadened the point‐spread function on the detector, significantly impacting the energy resolution under highly detuned conditions. A long detector distance of greater than 14 m is expected to achieve a high energy resolution of 100 meV and a range of 80 eV, enabling full spectral characterization of X‐ray free‐electron laser radiation as well as advanced spectroscopy techniques. Resolution enhancement on a single‐shot X‐ray spectrometer with a detuned non‐dispersive multi‐crystal analyzer is proposed and demonstrated, indicating the promising potential for capturing the full spectral information, including the fine‐spike structure in self‐amplified spontaneous emission X‐ray free‐electron laser radiation.
Publisher
International Union of Crystallography,John Wiley & Sons, Inc
