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Recrystallization in tantalum studied by positron annihilation
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Journal Article
Recrystallization in tantalum studied by positron annihilation
2025
Overview
Studies of positron annihilation during recrystallization in pure tantalum have been reported. The sequential annealing procedure of cold-rolled tantalum samples revealed a significant reduction in the mean positron lifetime in the temperature range from 650 to 1200°C, which is attributed to recrystallization. Detailed analysis of the data allowed us to determine the activation energy of grain boundary migration of 3.1±0.3 eV. In this temperature range, unlike other metals, an increase in microhardness was observed, which was detected in complementary studies of microhardness measurements and optical microscopy observations.
Publisher
IOP Publishing
