Journal Article

Incomplete Testing of SOC

Biswas, Santosh, Singh, Kunwer Mrityunjay, Deka, Jatindra

2023

Overview

Nowadays, System on Chip (SOC) based devices such as smartphones, tablets, cameras, and others are commonly used. The cost of these devices is determined by the expenses associated with their manufacturing and testing. In modern manufacturing technology, SOC-based devices have more cores embedded within them. However, testing these numerous cores thoroughly can be quite expensive and can sometimes cost more than the manufacturing itself. To make these devices more affordable for people from economically weaker backgrounds, it is necessary to come up with an efficient testing strategy that can help reduce the costs. In this study, we introduce a new method of testing the SOC incompletely instead of testing it thoroughly. This method involves compromising on the test quality, which may result in errors in the output. Incomplete testing is performed only for those cores of the SOC that can tolerate such errors. For example, incomplete testing is performed for the cores that are responsible for multimedia applications such as image or video display, where a slight compromise in the quality can be tolerated by human eyes. This incomplete testing helps to reduce the Test Power Consumption (TP), Test Access Time (TAT), and Test Data Volume (TDV) while compromising with the Fault Coverage (FC).

• Publisher: Springer Nature B.V
• Subject: Access time / Algorithms / Approximation / Circuits / Computer science / Design / Devices / Errors / Manufacturing / Methods / Multimedia / Power consumption / Smartphones / System on chip / Tablet computers / Video compression / Wireless communications