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Evaluation of a Pulse‐Excited PCB Resolver With Performance and Thermal Analysis
by
Celikel, Resat
, Yilmaz, Musa
, Aydogmus, Omur
in
Accuracy
/ Circuit boards
/ Design
/ Industrial applications
/ Manufacturing
/ Performance evaluation
/ Position errors
/ Printed circuits
/ Resolvers
/ Sensors
/ Thermal analysis
/ Thermal stress
/ Wave excitation
2026
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Evaluation of a Pulse‐Excited PCB Resolver With Performance and Thermal Analysis
by
Celikel, Resat
, Yilmaz, Musa
, Aydogmus, Omur
in
Accuracy
/ Circuit boards
/ Design
/ Industrial applications
/ Manufacturing
/ Performance evaluation
/ Position errors
/ Printed circuits
/ Resolvers
/ Sensors
/ Thermal analysis
/ Thermal stress
/ Wave excitation
2026
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Do you wish to request the book?
Evaluation of a Pulse‐Excited PCB Resolver With Performance and Thermal Analysis
by
Celikel, Resat
, Yilmaz, Musa
, Aydogmus, Omur
in
Accuracy
/ Circuit boards
/ Design
/ Industrial applications
/ Manufacturing
/ Performance evaluation
/ Position errors
/ Printed circuits
/ Resolvers
/ Sensors
/ Thermal analysis
/ Thermal stress
/ Wave excitation
2026
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Evaluation of a Pulse‐Excited PCB Resolver With Performance and Thermal Analysis
Journal Article
Evaluation of a Pulse‐Excited PCB Resolver With Performance and Thermal Analysis
2026
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Overview
This study evaluates the performance of a pulse‐excited printed circuit board (PCB) resolver in comparison with the traditional square‐wave excitation method. Although the pulse‐excited resolver exhibits slightly higher error levels than the square‐wave excitation approach, these differences remain acceptable for applications that prioritize reduced power consumption and improved thermal performance. Experimental results indicate that the average position errors of the resolver are 1.109° at low speeds and 0.338° at high speeds. These error levels are considered acceptable for a wide range of industrial applications. Thermal analysis demonstrates that the proposed pulse excitation method substantially reduces thermal stress on the resolver, yielding a maximum temperature of approximately 32.0°C during testing, compared with nearly 59.7°C under square‐wave excitation. Overall, the findings highlight the advantages of the proposed method, particularly for applications requiring effective heat management. The results suggest that the pulse‐excited resolver represents a viable alternative, combining operational efficiency with enhanced thermal performance.
Publisher
John Wiley & Sons, Inc
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