Journal Article

Optical Constants and Structural Properties of Epitaxial MoS2 Monolayers

Ermolaev, Georgy A., Romanov, Roman I., Volkov, Valentyn S., Doroshina, Natalia V., Voronin, Kirill V., Markeev, Andrey M., Vyshnevyy, Andrey A., El-Sayed, Marwa A., Tselikov, Gleb I., Voronov, Artem A., Tatmyshevskiy, Mikhail K., Nemtsov, Anton B., Novikov, Sergey M., Yakubovsky, Dmitry I., Arsenin, Aleksey V.

2021

Overview

Two-dimensional layers of transition-metal dichalcogenides (TMDs) have been widely studied owing to their exciting potential for applications in advanced electronic and optoelectronic devices. Typically, monolayers of TMDs are produced either by mechanical exfoliation or chemical vapor deposition (CVD). While the former produces high-quality flakes with a size limited to a few micrometers, the latter gives large-area layers but with a nonuniform surface resulting from multiple defects and randomly oriented domains. The use of epitaxy growth can produce continuous, crystalline and uniform films with fewer defects. Here, we present a comprehensive study of the optical and structural properties of a single layer of MoS2 synthesized by molecular beam epitaxy (MBE) on a sapphire substrate. For optical characterization, we performed spectroscopic ellipsometry over a broad spectral range (from 250 to 1700 nm) under variable incident angles. The structural quality was assessed by optical microscopy, atomic force microscopy, scanning electron microscopy, and Raman spectroscopy through which we were able to confirm that our sample contains a single-atomic layer of MoS2 with a low number of defects. Raman and photoluminescence spectroscopies revealed that MBE-synthesized MoS2 layers exhibit a two-times higher quantum yield of photoluminescence along with lower photobleaching compared to CVD-grown MoS2, thus making it an attractive candidate for photonic applications.

• Publisher: MDPI AG,MDPI
• Subject: Atomic force microscopy / Atomic properties / Chemical synthesis / Chemical vapor deposition / Crystal defects / dielectric properties / Electronic devices / Epitaxial growth / Epitaxy / Flakes (defects) / Light microscopy / Luminescence / Micrometers / Molecular beam epitaxy / Molybdenum disulfide / Monolayers / MoS2 monolayer / optical constants / Optical microscopy / Optical properties / Optoelectronic devices / Photobleaching / Photoluminescence / Photons / Point defects / Quality assessment / Raman spectroscopy / refractive index / Sapphire / Scanning electron microscopy / Semiconductors / Spectroellipsometry / Spectrum analysis / Substrates / Transition metal compounds / transition-metal dichalcogenides