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Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique
by
Pape, Sebastian
, Currás, Esteban
, Fernández García, Marcos
, Moll, Michael
in
Collaboration
/ Electric fields
/ Investigations
/ Lasers
/ Monte Carlo Method
/ Phantoms, Imaging
/ Photons
/ Radiometry - methods
/ Sensors
/ Silicon
/ silicon detectors
/ solid state detectors
/ Thrombolytic drugs
/ transient current technique
/ two photon absorption-transient current technique
2023
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Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique
by
Pape, Sebastian
, Currás, Esteban
, Fernández García, Marcos
, Moll, Michael
in
Collaboration
/ Electric fields
/ Investigations
/ Lasers
/ Monte Carlo Method
/ Phantoms, Imaging
/ Photons
/ Radiometry - methods
/ Sensors
/ Silicon
/ silicon detectors
/ solid state detectors
/ Thrombolytic drugs
/ transient current technique
/ two photon absorption-transient current technique
2023
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Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique
by
Pape, Sebastian
, Currás, Esteban
, Fernández García, Marcos
, Moll, Michael
in
Collaboration
/ Electric fields
/ Investigations
/ Lasers
/ Monte Carlo Method
/ Phantoms, Imaging
/ Photons
/ Radiometry - methods
/ Sensors
/ Silicon
/ silicon detectors
/ solid state detectors
/ Thrombolytic drugs
/ transient current technique
/ two photon absorption-transient current technique
2023
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Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique
Journal Article
Techniques for the Investigation of Segmented Sensors Using the Two Photon Absorption-Transient Current Technique
2023
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Overview
The two photon absorption-transient current technique (TPA-TCT) was used to investigate a silicon strip detector with illumination from the top. Measurement and analysis techniques for the TPA-TCT of segmented devices are presented and discussed using a passive strip CMOS detector and a standard strip detector as an example. The influence of laser beam clipping and reflection is shown, and a method that allows to compensate these intensity-related effects for investigation of the electric field is introduced and successfully employed. Additionally, the mirror technique is introduced, which exploits reflection at a metallised back side to enable the measurement directly below a top metallisation while illuminating from the top.
Publisher
MDPI AG,MDPI
Subject
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