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In situ mechanical testing in an SEM performed at 1150°C with submicron resolution
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In situ mechanical testing in an SEM performed at 1150°C with submicron resolution
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Journal Article
In situ mechanical testing in an SEM performed at 1150°C with submicron resolution
2020
Overview
To get nanoscopic and microscopic details, compression, tensile, or crack propagation tests can also be conducted inside a scanning electron microscope (SEM). After calibration procedures to correct for thermal expansion of the device itself, control tests were done using standard specimens made of carbon steel. [...]the setup was used to stretch at 1150°C a single-crystal Ni superalloy specimen with a notch on its side.
Publisher
Cambridge University Press,Springer International Publishing,Springer Nature B.V
