Asset Details
Do you wish to reserve the book?
Identifying and Understanding the Positive Impact of Defects for Optoelectronic Devices
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Identifying and Understanding the Positive Impact of Defects for Optoelectronic Devices
Do you wish to request the book?
Identifying and Understanding the Positive Impact of Defects for Optoelectronic Devices
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Journal Article
Identifying and Understanding the Positive Impact of Defects for Optoelectronic Devices
2024
Overview
Defects are generally regarded to have negative impacts on carrier recombination, charge transport, and ion migration in materials, which thus lower the efficiency, speed, and stability of optoelectronic devices. Meanwhile, lots of efforts which focused on minimizing defects have greatly improved the performances of devices. Then, can defects be positive in optoelectronic devices? Herein, relying on in‐depth understanding of defect‐associated effects in semiconductors, trapping of photo‐generated carriers by defects is applied to enlarge photoconductive gain in photodetection. Therefore, the record photoconductive gain, gain‐bandwidth product, and detection limit are achieved in this photodetector. Exceeding the general concept that defects are harmful, a new view that the defects can be positive in photodetection is identified, which may guide to design high‐performance photodetectors. Relying on in‐depth understanding of defect‐associated effects in semiconductors, trapping of photo‐generated carriers by defects is applied to enlarge photoconductive and the record performances are achieved in this photodetector. Exceeding the general concept that defects are harmful, a new view that defects are positive in optoelectronics is identified, which will guide us to design high‐performance devices in the future.
Publisher
John Wiley & Sons, Inc,Wiley-VCH
