MbrlCatalogueTitleDetail

Do you wish to reserve the book?
High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals
High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals
Hey, we have placed the reservation for you!
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
You are currently in the queue to collect this book. You will be notified once it is your turn to collect the book.
Oops! Something went wrong.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals
Oops! Something went wrong.
Oops! Something went wrong.
While trying to remove the title from your shelf something went wrong :( Kindly try again later!
Title added to your shelf!
Title added to your shelf!
View what I already have on My Shelf.
Oops! Something went wrong.
Oops! Something went wrong.
While trying to add the title to your shelf something went wrong :( Kindly try again later!
Do you wish to request the book?
High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals
High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals

Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
How would you like to get it?
We have requested the book for you! Sorry the robot delivery is not available at the moment
We have requested the book for you!
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals
High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals
Journal Article

High‐performance 110 kVp hard x‐ray detector based on all‐crystalline‐surface passivated perovskite single crystals

2024
Request Book From Autostore and Choose the Collection Method
Overview
Halide perovskite single crystals (SCs) have attracted much attention for their application in high‐performance x‐ray detectors owing to their desirable properties, including low defect density, high mobility–lifetime product (μτ), and long carrier diffusion length. However, suppressing the inherent defects in perovskites and overcoming the ion migration primarily caused by these defects remains a challenge. This study proposes a facile process for dipping Cs0.05FA0.9MA0.05PbI3 SCs synthesized by a solution‐based inverse temperature crystallization method into a 2‐phenylethylammonium iodide (PEAI) solution to reduce the number of defects, inhibit ion migration, and increase x‐ray sensitivity. Compared to conventional spin coating, this simple dipping process forms a two‐dimensional PEA2PbI4 layer on all SC surfaces without further treatment, effectively passivating all surfaces of the inherently defective SCs and minimizing ion migration. As a result, the PEAI‐treated perovskite SC‐based x‐ray detector achieves a record x‐ray sensitivity of 1.3 × 105 μC Gyair−1 cm−2 with a bias voltage of 30 V at realistic clinical dose rates of 1–5 mGy s−1 (peak potential of 110 kVp), which is 6 times more sensitive than an untreated SC‐based detector and 3 orders of magnitude more sensitive than a commercial α‐Se‐based detector. Furthermore, the PEAI‐treated‐perovskite SC‐based x‐ray detector exhibits a low detection limit (73 nGy s−1), improved x‐ray response, and clear x‐ray images by a scanning method, highlighting the effectiveness of the PEAI dipping approach for fabricating next‐generation x‐ray detectors. This study presents a novel PEAI solution dipping scheme to passivate defects present on all exposed surfaces of perovskite single crystals. This treatment forms 2D PEA2PbI4 without further annealing and effectively passivates all surfaces of the single crystal, resulting in a significant improvement in transport properties and an increase in activation energy for ion migration. The x‐ray detector showed a record high sensitivity of 1.3 × 105 μC Gyair−1 cm−2 at the clinical dose rate and provided x‐ray images without a multiplexer circuit.