Asset Details
Do you wish to reserve the book?
Direct spectrum analysis using a threshold detector with application to a superconducting circuit
Hey, we have placed the reservation for you!
By the way, why not check out events that you can attend while you pick your title.
Oops! Something went wrong.
Looks like we were not able to place the reservation. Kindly try again later.
Are you sure you want to remove the book from the shelf?
Direct spectrum analysis using a threshold detector with application to a superconducting circuit
Do you wish to request the book?
Direct spectrum analysis using a threshold detector with application to a superconducting circuit
Please be aware that the book you have requested cannot be checked out. If you would like to checkout this book, you can reserve another copy
We have requested the book for you!
Your request is successful and it will be processed during the Library working hours. Please check the status of your request in My Requests.
Oops! Something went wrong.
Looks like we were not able to place your request. Kindly try again later.
Journal Article
Direct spectrum analysis using a threshold detector with application to a superconducting circuit
2014
Overview
We introduce a new and quantitative theoretical framework for noise spectral analysis using a threshold detector, which is then applied to a superconducting device: the Josephson bifurcation amplifier. We show that this new framework provides direct access to the environmental noise spectrum with a sensitivity approaching the standard quantum limit of weak continuous measurements. In addition, the accessible frequency range of the spectrum is, in principle, limited only by the ring down time of the resonant mode. This on-chip noise detector is non-dissipative and works with low probing powers, allowing it to be operated at low temperatures ( mK). We exploit this technique for measuring the frequency fluctuations of our device and find a low frequency noise with an amplitude and spectrum compatible with a dielectric origin.
Publisher
IOP Publishing
Subject
