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Electronic structure formed by Y2O3-doping in lithium position assists improvement of charging-voltage for high-nickel cathodes
Electronic structure formed by Y2O3-doping in lithium position assists improvement of charging-voltage for high-nickel cathodes
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Electronic structure formed by Y2O3-doping in lithium position assists improvement of charging-voltage for high-nickel cathodes
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Electronic structure formed by Y2O3-doping in lithium position assists improvement of charging-voltage for high-nickel cathodes
Electronic structure formed by Y2O3-doping in lithium position assists improvement of charging-voltage for high-nickel cathodes
Journal Article

Electronic structure formed by Y2O3-doping in lithium position assists improvement of charging-voltage for high-nickel cathodes

2025
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Overview
High-capacity power battery can be attained through the elevation of the cut-off voltage for LiNi 0.83 Co 0.12 Mn 0.05 O 2 high-nickel material. Nevertheless, unstable lattice oxygen would be released during the lithium deep extraction. To solve the above issues, the electronic structure is reconstructed by substituting Li + ions with Y 3+ ions. The dopant within the Li layer could transfer electrons to the adjacent lattice oxygen. Subsequently, the accumulated electrons in the oxygen site are transferred to nickel of highly valence state under the action of the reduction coupling mechanism. The modified strategy suppresses the generation of oxygen defects by regulating the local electronic structure, but more importantly, it reduces the concentration of highly reactive Ni 4+ species during the charging state, thus avoiding the evolution of an unexpected phase transition. Strengthening the coupling strength between the lithium layers and transition metal layers finally realizes the fast-charging performance improvement and the cycling stability enhancement under high voltage. Authors report on restructuring the electronic structure of a high-nickel material by substituting Li + ions with Y 3+ ions. This strategy suppresses the generation of oxygen defects with a reduction coupling mechanism improving high-voltage stability.